Influence of the atomic force microscope tip on the multifractal analysis of rough surfaces

KLAPETEK, Petr, Ivan OHLÍDAL and Jindřich BÍLEK. Influence of the atomic force microscope tip on the multifractal analysis of rough surfaces. Ultramicroscopy. Amsterdam: Elsevier, 2004, vol. 102, No 1, p. 51-59. ISSN 0304-3991.

Basic information

Original name

Influence of the atomic force microscope tip on the multifractal analysis of rough surfaces

Name in Czech

Vliv

Authors

KLAPETEK, Petr (203 Czech Republic), Ivan OHLÍDAL (203 Czech Republic, guarantor) and Jindřich BÍLEK (203 Czech Republic)

Edition

Ultramicroscopy, Amsterdam, Elsevier, 2004, 0304-3991

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Other information

Language

English

Type of outcome

Článek v odborném periodiku

Field of Study

10302 Condensed matter physics

Country of publisher

Netherlands

Confidentiality degree

není předmětem státního či obchodního tajemství

Impact factor

Impact factor: 2.215

Organization unit

Faculty of Science

UT WoS

000225516200007

Keywords in English

Roughness; AFM

Tags

AFM, Roughness

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Abstract

V originále

In this paper ...

In Czech

V tomto článku ...

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Links

GA101/01/1104, research and development project	Name: Realizace laboratorního vzoru zařízení pro měření drsnosti povrchu metodou holografické interferometrie Investor: Czech Science Foundation, Realisation of thelaboratory instrument for surface roughness measurement by holographic interferometry
GA202/01/1110, research and development project	Name: Optické a mechanické vlastnosti tenkých vrstev DLC:Si připravených PECVD metodou Investor: Czech Science Foundation, Optical and mechanical properties of DLC : Si thin films prepared by the PECVD method