KLAPETEK, Petr, Ivan OHLÍDAL and Jindřich BÍLEK. Influence of the atomic force microscope tip on the multifractal analysis of rough surfaces. Ultramicroscopy. Amsterdam: Elsevier, 2004, vol. 102, No 1, p. 51-59. ISSN 0304-3991.
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Basic information
Original name Influence of the atomic force microscope tip on the multifractal analysis of rough surfaces
Name in Czech Vliv
Authors KLAPETEK, Petr (203 Czech Republic), Ivan OHLÍDAL (203 Czech Republic, guarantor) and Jindřich BÍLEK (203 Czech Republic).
Edition Ultramicroscopy, Amsterdam, Elsevier, 2004, 0304-3991.
Other information
Original language English
Type of outcome Article in a journal
Field of Study 10302 Condensed matter physics
Country of publisher Netherlands
Confidentiality degree is not subject to a state or trade secret
Impact factor Impact factor: 2.215
Organization unit Faculty of Science
UT WoS 000225516200007
Keywords in English Roughness; AFM
Tags AFM, Roughness
Changed by Changed by: prof. RNDr. Ivan Ohlídal, DrSc., učo 2397. Changed: 15/8/2005 18:25.
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GA101/01/1104, research and development projectName: Realizace laboratorního vzoru zařízení pro měření drsnosti povrchu metodou holografické interferometrie
Investor: Czech Science Foundation, Realisation of thelaboratory instrument for surface roughness measurement by holographic interferometry
GA202/01/1110, research and development projectName: Optické a mechanické vlastnosti tenkých vrstev DLC:Si připravených PECVD metodou
Investor: Czech Science Foundation, Optical and mechanical properties of DLC : Si thin films prepared by the PECVD method
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