KLAPETEK, Petr, Ivan OHLÍDAL and Jindřich BÍLEK. Influence of the atomic force microscope tip on the multifractal analysis of rough surfaces. Ultramicroscopy. Amsterdam: Elsevier, 2004, vol. 102, No 1, p. 51-59. ISSN 0304-3991. |
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@article{574146, author = {Klapetek, Petr and Ohlídal, Ivan and Bílek, Jindřich}, article_location = {Amsterdam}, article_number = {1}, keywords = {Roughness; AFM}, language = {eng}, issn = {0304-3991}, journal = {Ultramicroscopy}, title = {Influence of the atomic force microscope tip on the multifractal analysis of rough surfaces}, volume = {102}, year = {2004} }
TY - JOUR ID - 574146 AU - Klapetek, Petr - Ohlídal, Ivan - Bílek, Jindřich PY - 2004 TI - Influence of the atomic force microscope tip on the multifractal analysis of rough surfaces JF - Ultramicroscopy VL - 102 IS - 1 SP - 51-59 EP - 51-59 PB - Elsevier SN - 03043991 KW - Roughness KW - AFM N2 - In this paper ... ER -
KLAPETEK, Petr, Ivan OHLÍDAL and Jindřich BÍLEK. Influence of the atomic force microscope tip on the multifractal analysis of rough surfaces. \textit{Ultramicroscopy}. Amsterdam: Elsevier, 2004, vol.~102, No~1, p.~51-59. ISSN~0304-3991.
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