| FRANTA, Daniel, Beatrice NEGULESCU, Luc THOMAS, Pierre Richard DAHOO, Marcel GUYOT, Ivan OHLÍDAL, Jan MISTRÍK and Tomuo YAMAGUCHI. Optical properties of NiO thin films prepared by pulsed laser deposition technique. Applied Surface Science. USA: ELSEVIER (NORTH-HOLLAND), 2005, vol. 244, 1-4, p. 426-430. ISSN 0169-4332. |
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@article{621484,
author = {Franta, Daniel and Negulescu, Beatrice and Thomas, Luc and Dahoo, Pierre Richard and Guyot, Marcel and Ohlídal, Ivan and Mistrík, Jan and Yamaguchi, Tomuo},
article_location = {USA},
article_number = {1-4},
keywords = {NiO films; Optical constants; Ellipsometry; Reflectometry},
language = {eng},
issn = {0169-4332},
journal = {Applied Surface Science},
title = {Optical properties of NiO thin films prepared by pulsed laser deposition technique},
url = {http://hydra.physics.muni.cz/~franta/bib/ASS244_426.html},
volume = {244},
year = {2005}
}
TY - JOUR
ID - 621484
AU - Franta, Daniel - Negulescu, Beatrice - Thomas, Luc - Dahoo, Pierre Richard - Guyot, Marcel - Ohlídal, Ivan - Mistrík, Jan - Yamaguchi, Tomuo
PY - 2005
TI - Optical properties of NiO thin films prepared by pulsed laser deposition technique
JF - Applied Surface Science
VL - 244
IS - 1-4
SP - 426-430
EP - 426-430
PB - ELSEVIER (NORTH-HOLLAND)
SN - 01694332
KW - NiO films
KW - Optical constants
KW - Ellipsometry
KW - Reflectometry
UR - http://hydra.physics.muni.cz/~franta/bib/ASS244_426.html
N2 - In this paper the optical characterization of the NiO thin films prepared by pulsed laser deposition technique onto the quartz substrate were performed using multi-sample modification of the combined optical method based on measuring and interpreting the experimental data obtained by variable angle spectroscopic ellipsometry and spectrophotometry in reflected and transmitted light. A new dispersion model of the optical constants of the NiO films was also used. This dispersion model was based on parameterizing of the joint density of states together with the Gaussian broadening. The defects consiting in boundary roughness and refractive index profile were taken into account in optical characterization of the NiO films too. The spectral dependences of the optical constants together with the parameters characterizing the defects of these films were determined.
ER -
FRANTA, Daniel, Beatrice NEGULESCU, Luc THOMAS, Pierre Richard DAHOO, Marcel GUYOT, Ivan OHLÍDAL, Jan MISTRÍK and Tomuo YAMAGUCHI. Optical properties of NiO thin films prepared by pulsed laser deposition technique. \textit{Applied Surface Science}. USA: ELSEVIER (NORTH-HOLLAND), 2005, vol.~244, 1-4, p.~426-430. ISSN~0169-4332.
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