MISTRÍK, Jan, Tomuo YAMAGUCHI, Daniel FRANTA, Ivan OHLÍDAL, Gu Jin HU and Ning DAI. Optical properties of slightly rough LaNiO3 thin films studied by spectroscopic ellipsometry and reflectometry. Applied Surface Science. USA: ELSEVIER (NORTH-HOLLAND), 2005, vol. 244, 1-4, p. 431-434. ISSN 0169-4332. |
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@article{621519, author = {Mistrík, Jan and Yamaguchi, Tomuo and Franta, Daniel and Ohlídal, Ivan and Hu, Gu Jin and Dai, Ning}, article_location = {USA}, article_number = {1-4}, keywords = {Ellipsometry; Reflectometry; Optical constants; LNO; LaNiO3}, language = {eng}, issn = {0169-4332}, journal = {Applied Surface Science}, title = {Optical properties of slightly rough LaNiO3 thin films studied by spectroscopic ellipsometry and reflectometry}, url = {http://hydra.physics.muni.cz/~franta/bib/ASS244_431.html}, volume = {244}, year = {2005} }
TY - JOUR ID - 621519 AU - Mistrík, Jan - Yamaguchi, Tomuo - Franta, Daniel - Ohlídal, Ivan - Hu, Gu Jin - Dai, Ning PY - 2005 TI - Optical properties of slightly rough LaNiO3 thin films studied by spectroscopic ellipsometry and reflectometry JF - Applied Surface Science VL - 244 IS - 1-4 SP - 431-434 EP - 431-434 PB - ELSEVIER (NORTH-HOLLAND) SN - 01694332 KW - Ellipsometry KW - Reflectometry KW - Optical constants KW - LNO KW - LaNiO3 UR - http://hydra.physics.muni.cz/~franta/bib/ASS244_431.html N2 - Optical characterization of sol-gel deposited lanthanum nickel oxide, LaNiO3 (LNO) film on Pt-coated Si substrate was performed by spectroscopic ellipsometry and reflectometry. The sum of five Lorentz oscillators was used for LNO dispersion parameterization in spectral range from 190 to 1000 nm. Two theoretical approaches: Raileigh-Rice theory (RRT) and effective medium approximation (EMA) were considered to account for the effect of LNO upper boundary roughness. Root mean square (rms) values of the heights of irregularities obtained by atomic force microscopy (AFM) and RRT were 2.09 and 5.62 nm, respectively. Effective layer thickness in EMA approach was found to be 4.62 nm. Higher values of roughness determined from optical methods with respect to the AFM may be assigned to the effect of convolution of AFM tip and boundary irregularities. ER -
MISTRÍK, Jan, Tomuo YAMAGUCHI, Daniel FRANTA, Ivan OHLÍDAL, Gu Jin HU and Ning DAI. Optical properties of slightly rough LaNiO3 thin films studied by spectroscopic ellipsometry and reflectometry. \textit{Applied Surface Science}. USA: ELSEVIER (NORTH-HOLLAND), 2005, vol.~244, 1-4, p.~431-434. ISSN~0169-4332.
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