BIRKHOLZ, Mario. Thin film analysis by X-ray scattering. Edited by Paul F. Fewster - Christoph Genzel. Weinheim: Wiley-VCH, 2006, xxii, 356. ISBN 3527310525. |
Other formats:
BibTeX
LaTeX
RIS
|
Basic information | |
---|---|
Original name | Thin film analysis by X-ray scattering |
Authors | BIRKHOLZ, Mario. Edited by Paul F. Fewster - Christoph Genzel. |
Edition | Weinheim, xxii, 356, 2006. |
Publisher | Wiley-VCH |
Other information | |
---|---|
ISBN | 3527310525 |
Changed by | The record has been imported from the library system. Changed: 8/8/2022 13:23. |
PrintDisplayed: 18/8/2024 14:18