LÜBBERT, D., Petr MIKULÍK, P. PERNOT, L. HELFEN, M.D. CRAVEN, S. KELLER, S. DENBAARS and T. BAUMBACH. X-ray microdiffraction imaging investigations of wing tilt in epitaxially overgrown GaN. Physica stat.sol.(a). 2006, vol. 203, No 7, p. 1733-1738. ISSN 0031-8965.
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Basic information
Original name X-ray microdiffraction imaging investigations of wing tilt in epitaxially overgrown GaN
Name in Czech Studium rozorientace křídel laterálně přerostlých GaN rtg mikrodifrakčním zobrazováním
Authors LÜBBERT, D. (276 Germany), Petr MIKULÍK (276 Germany, guarantor), P. PERNOT (203 Czech Republic), L. HELFEN (276 Germany), M.D. CRAVEN (840 United States of America), S. KELLER (840 United States of America), S. DENBAARS (840 United States of America) and T. BAUMBACH (276 Germany).
Edition Physica stat.sol.(a), 2006, 0031-8965.
Other information
Original language English
Type of outcome Article in a journal
Field of Study 10302 Condensed matter physics
Country of publisher Germany
Confidentiality degree is not subject to a state or trade secret
WWW URL
Impact factor Impact factor: 1.221
RIV identification code RIV/00216224:14310/06:00017349
Organization unit Faculty of Science
UT WoS 000238034600046
Keywords in English lattice tilt; diffraction; X-ray diffraction; GaN; ELO
Tags diffraction, ELO, GaN, lattice tilt, X-ray diffraction
Tags International impact, Reviewed
Changed by Changed by: doc. RNDr. Petr Mikulík, Ph.D., učo 855. Changed: 12/2/2007 18:36.
Abstract
The crystalline quality in epitaxially laterally overgrown (ELO) GaN and the amount of wing tilt is characterized on a local basis, with high spatial and angular resolution. A method of full-field X-ray microdiffraction imaging, termed rocking curve imaging, is used to record simultaneously a large set of local X-ray diffraction profiles originating from sample surface areas of micrometer size. x-omega maps of diffracted intensity allow to quantify the amount of wing tilt in individual lateral ELO periods as well as to monitor the fluctuations of tilt between adjacent periods. Automated shape analysis of the full set of local rocking curves provides a means to quantitatively characterize the local crystalline perfection of GaN. The ELO window and wing regions can be clearly separated; comparison indicates an average improvement of crystal quality by a factor 3–4 due to the lateral overgrowth process.
Abstract (in Czech)
Krystalová kvalita v epitaxně přerostlých (ELO) GaN vrstvách a velikost rozorientace křídel jsou charakterizovány lokálně, s vysokým prostorovým i úhlovým rozlišením. K tomu jsme použili metodu plného zobrazení rtg mikrodifrakčním zobrazením, též zvaného rocking curve imaging (RCI). ELO okna a křídla mohou být jasně separována; srovnání ukazuje na zlepšení krystalinity faktorem 3–4 díky procesu laterálního přerostení.
Links
MSM0021622410, plan (intention)Name: Fyzikální a chemické vlastnosti pokročilých materiálů a struktur
Investor: Ministry of Education, Youth and Sports of the CR, Physical and chemical properties of advanced materials and structures
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