Optical Restriction of Plasma Emission Light for Nanometric
Sampling Depth and Depth Profiling of Multilayered Metal
Samples

J 2007

Optical Restriction of Plasma Emission Light for Nanometric Sampling Depth and Depth Profiling of Multilayered Metal Samples

CTVRTNICKOVA, Tereza; Fran Javier FORTES; Luisa Maria CABALIN a Javier LASERNA

Základní údaje

Originální název

Optical Restriction of Plasma Emission Light for Nanometric Sampling Depth and Depth Profiling of Multilayered Metal Samples

Autoři

CTVRTNICKOVA, Tereza; Fran Javier FORTES; Luisa Maria CABALIN a Javier LASERNA

Vydání

Applied Spectroscopy, USA, Society Appl. Spectroscopy, 2007, 0003-7028

Další údaje

Typ výsledku

Článek v odborném periodiku

Utajení

není předmětem státního či obchodního tajemství

Odkazy

URL

Impakt faktor

Impact factor: 1.902

Organizační jednotka

Přírodovědecká fakulta

UT WoS

000247979100008

Klíčová slova anglicky

Laser-induced breakdown spectrometry; LIBS; Depth profiling; Optical restriction; multilayered samples

Štítky

Depth profiling, laser-induced breakdown spectrometry, LIBS, multilayered samples, Optical restriction

Příznaky

Mezinárodní význam

Změněno: 31. 10. 2007 11:02, Ing. Tereza Čtvrtníčková, Ph.D.

Anotace

V originále

Improvement in depth profiling capabilities of laser-induced breakdown spectrometry (LIBS) for multilayered samples has been attempted. For this purpose, in a typical LIBS experiment, an optical restriction consisting of a pinhole placed between the dichroic mirror and the collecting lenses has been used. This new optical approach allows observing only the light emission coming from the central region of the plume. The microplasma was created on the sample by a pulsed Nd:YAG laser operating at 1064 nm with a homogeneous distribution of energy across the beam. Light emitted by the microplasma was detected with an intensified charge-coupled device (iCCD) multichannel detector. The effect of pinhole diameter and the delay time influence on depth analysis have been assessed. An ablation range of only a few nanometers per pulse has been achieved. Depth profiles of various metals (Cr, Ni, Cu) from multilayered samples have been generated by LIBS and depth resolution at different delay times using various pinhole diameters have been calculated and compared.

Citovat

CTVRTNICKOVA, Tereza; Fran Javier FORTES; Luisa Maria CABALIN a Javier LASERNA. Optical Restriction of Plasma Emission Light for Nanometric Sampling Depth and Depth Profiling of Multilayered Metal Samples. Applied Spectroscopy. USA: Society Appl. Spectroscopy, 2007, roč. 61, č. 7, s. 719 - 724. ISSN 0003-7028.

@article{726863,
   author = {Ctvrtnickova, Tereza and Fortes, Fran Javier and Cabalin, Luisa Maria and Laserna, Javier},
   article_location = {USA},
   article_number = {7},
   keywords = {Laser-induced breakdown spectrometry; LIBS; Depth profiling; Optical restriction; multilayered samples},
   issn = {0003-7028},
   journal = {Applied Spectroscopy},
   title = {Optical Restriction of Plasma Emission Light for Nanometric Sampling Depth and Depth Profiling of Multilayered Metal Samples},
   url = {http://ejournals.ebsco.com/Article.asp?ContributionID=12336488},
   volume = {61},
   year = {2007}
}

TY  - JOUR
ID  - 726863
AU  - Ctvrtnickova, Tereza - Fortes, Fran Javier - Cabalin, Luisa Maria - Laserna, Javier
PY  - 2007
TI  - Optical Restriction of Plasma Emission Light for Nanometric Sampling Depth and Depth Profiling of Multilayered Metal Samples
JF  - Applied Spectroscopy
VL  - 61
IS  - 7
SP  - 719 - 724
EP  - 719 - 724
PB  - Society Appl. Spectroscopy
SN  - 00037028
KW  - Laser-induced breakdown spectrometry
KW  - LIBS
KW  - Depth profiling
KW  - Optical restriction
KW  - multilayered samples
UR  - http://ejournals.ebsco.com/Article.asp?ContributionID=12336488
N2  - Improvement in depth profiling capabilities of laser-induced breakdown spectrometry (LIBS) for multilayered samples has been attempted. For this purpose, in a typical LIBS experiment, an optical restriction consisting of a pinhole placed between the dichroic mirror and the collecting lenses has been used. This new optical approach allows observing only the light emission coming from the central region of the plume. The microplasma was created on the sample by a pulsed Nd:YAG laser operating at 1064 nm with a homogeneous distribution of energy across the beam. Light emitted by the microplasma was detected with an intensified charge-coupled device (iCCD) multichannel detector. The effect of pinhole diameter and the delay time influence on depth analysis have been assessed. An ablation range of only a few nanometers per pulse has been achieved. Depth profiles of various metals (Cr, Ni, Cu) from multilayered samples have been generated by LIBS and depth resolution at different delay times using various pinhole diameters have been calculated and compared.
ER  -

CTVRTNICKOVA, Tereza; Fran Javier FORTES; Luisa Maria CABALIN a Javier LASERNA. Optical Restriction of Plasma Emission Light for Nanometric Sampling Depth and Depth Profiling of Multilayered Metal Samples. \textit{Applied Spectroscopy}. USA: Society Appl. Spectroscopy, 2007, roč.~61, č.~7, s.~719 - 724. ISSN~0003-7028.

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