CTVRTNICKOVA, Tereza, Fran Javier FORTES, Luisa Maria CABALIN a Javier LASERNA. Optical Restriction of Plasma Emission Light for Nanometric Sampling Depth and Depth Profiling of Multilayered Metal Samples. Applied Spectroscopy. USA: Society Appl. Spectroscopy, 2007, roč. 61, č. 7, s. 719 - 724. ISSN 0003-7028. |
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@article{726863, author = {Ctvrtnickova, Tereza and Fortes, Fran Javier and Cabalin, Luisa Maria and Laserna, Javier}, article_location = {USA}, article_number = {7}, keywords = {Laser-induced breakdown spectrometry; LIBS; Depth profiling; Optical restriction; multilayered samples}, issn = {0003-7028}, journal = {Applied Spectroscopy}, title = {Optical Restriction of Plasma Emission Light for Nanometric Sampling Depth and Depth Profiling of Multilayered Metal Samples}, url = {http://ejournals.ebsco.com/Article.asp?ContributionID=12336488}, volume = {61}, year = {2007} }
TY - JOUR ID - 726863 AU - Ctvrtnickova, Tereza - Fortes, Fran Javier - Cabalin, Luisa Maria - Laserna, Javier PY - 2007 TI - Optical Restriction of Plasma Emission Light for Nanometric Sampling Depth and Depth Profiling of Multilayered Metal Samples JF - Applied Spectroscopy VL - 61 IS - 7 SP - 719 - 724 EP - 719 - 724 PB - Society Appl. Spectroscopy SN - 00037028 KW - Laser-induced breakdown spectrometry KW - LIBS KW - Depth profiling KW - Optical restriction KW - multilayered samples UR - http://ejournals.ebsco.com/Article.asp?ContributionID=12336488 N2 - Improvement in depth profiling capabilities of laser-induced breakdown spectrometry (LIBS) for multilayered samples has been attempted. For this purpose, in a typical LIBS experiment, an optical restriction consisting of a pinhole placed between the dichroic mirror and the collecting lenses has been used. This new optical approach allows observing only the light emission coming from the central region of the plume. The microplasma was created on the sample by a pulsed Nd:YAG laser operating at 1064 nm with a homogeneous distribution of energy across the beam. Light emitted by the microplasma was detected with an intensified charge-coupled device (iCCD) multichannel detector. The effect of pinhole diameter and the delay time influence on depth analysis have been assessed. An ablation range of only a few nanometers per pulse has been achieved. Depth profiles of various metals (Cr, Ni, Cu) from multilayered samples have been generated by LIBS and depth resolution at different delay times using various pinhole diameters have been calculated and compared. ER -
CTVRTNICKOVA, Tereza, Fran Javier FORTES, Luisa Maria CABALIN a Javier LASERNA. Optical Restriction of Plasma Emission Light for Nanometric Sampling Depth and Depth Profiling of Multilayered Metal Samples. \textit{Applied Spectroscopy}. USA: Society Appl. Spectroscopy, 2007, roč.~61, č.~7, s.~719 - 724. ISSN~0003-7028.
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