Interface roughness in SiGe quantum-cascade structures from x-ray reflectivity studies

ROCH, Tomáš, Mojmír MEDUŇA, Julian STANGL, Anke HESSE, Rainer T LECHNER, Guenther BAUER, G. DEHLINGER, L. DIEHL, U. GENNSER, Elisabeth MÜLLER and Detlev GRÜTZMACHER. Interface roughness in SiGe quantum-cascade structures from x-ray reflectivity studies. Journal of Applied Physics. USA: American Institute of Physics, 2001, vol. 91, No 11, p. 8974-8978. ISSN 0021-8979.

Basic information

Original name

Interface roughness in SiGe quantum-cascade structures from x-ray reflectivity studies

Name in Czech

Drsnost rozhraní v SiGe kvantumkaskádových strukturách ze studií rtg reflektivity

Authors

ROCH, Tomáš (703 Slovakia), Mojmír MEDUŇA (203 Czech Republic, guarantor), Julian STANGL (40 Austria), Anke HESSE (276 Germany), Rainer T LECHNER (40 Austria), Guenther BAUER (40 Austria), G. DEHLINGER (756 Switzerland), L. DIEHL (756 Switzerland), U. GENNSER (756 Switzerland), Elisabeth MÜLLER (756 Switzerland) and Detlev GRÜTZMACHER (276 Germany)

Edition

Journal of Applied Physics, USA, American Institute of Physics, 2001, 0021-8979

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Other information

Language

English

Type of outcome

Článek v odborném periodiku

Field of Study

10302 Condensed matter physics

Country of publisher

United States of America

Confidentiality degree

není předmětem státního či obchodního tajemství

Impact factor

Impact factor: 2.128

Organization unit

Faculty of Science

UT WoS

000175708900007

Keywords in English

superlatitces; multilayers; scattering; quality

Tags

multilayers, Quality, SCATTERING, superlatitces

Tags

International impact, Reviewed

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Abstract

V originále

We have investigated the structural properties of Si/SiGe electroluiminescent quantum-cascade structures, by means of x-ray reflectivity and diffraction.

In Czech

Studovali jsme strukturní vlastnosti Si/SiGe elektroluminescentních kvantových kaskádových struktur pomocí rtg reflektivity a difrakce.