MARŠÍK, Přemysl and Josef HUMLÍČEK. Multiplate misalignment artifacts in rotating-complensator ellipsometry: Analysis and data treatment. physica status solidi (c). Weinheim: WILEY-VCH Verlag GmbH, 2008, vol. 5, No 5, p. 1064-1067. ISSN 1610-1634.
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Basic information
Original name Multiplate misalignment artifacts in rotating-complensator ellipsometry: Analysis and data treatment
Name in Czech Artefakty v elipsometrii s rotačním kompenzátorem: analýza a zacházení s daty
Authors MARŠÍK, Přemysl (203 Czech Republic) and Josef HUMLÍČEK (203 Czech Republic, guarantor).
Edition physica status solidi (c), Weinheim, WILEY-VCH Verlag GmbH, 2008, 1610-1634.
Other information
Original language English
Type of outcome Article in a journal
Field of Study 10302 Condensed matter physics
Country of publisher Czech Republic
Confidentiality degree is not subject to a state or trade secret
RIV identification code RIV/00216224:14310/08:00026013
Organization unit Faculty of Science
UT WoS 000256862500015
Keywords in English ellipsometry; rotating compensator
Tags ellipsometry, rotating compensator
Tags International impact, Reviewed
Changed by Changed by: Mgr. Přemysl Maršík, Ph.D., učo 13477. Changed: 9/4/2010 16:47.
Abstract
Rotating compensator ellipsometry using multi-plate retarders can suffer from various artifacts. Our measurements in the range from 1.4 to 6.2 eV revealed spurious oscillations in ellipsometric parameters. We assign these oscillations to the angular misalignment between the individual plates of the retarder. A simple model using Mueller matrix framework is constructed to describe the observed effects and to elucidate the origin of the artifacts. The model is used to predict the impact of the artifacts on the results of signal analysis, and a calibration procedure is presented. Finally, the knowledge of the origin of the artifacts has been successfully used to reduce substantially the spurious oscillations in measured data.
Abstract (in Czech)
Elipsometrie s rotujícím kompenzátorem, používající vícedeskové retardéry, může trpět různými artefakty. Naše měření v oboru 1.4 až 6.2 eV odhalila rušivé oscilace elipsometrických parametrů Tyto oscilace přiřazujeme nesouladu úhlových poloh jednotlivých desek retardéru.
Links
MSM0021622410, plan (intention)Name: Fyzikální a chemické vlastnosti pokročilých materiálů a struktur
Investor: Ministry of Education, Youth and Sports of the CR, Physical and chemical properties of advanced materials and structures
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