LÜBBERT, D., T. BAUMBACH, Václav HOLÝ, Petr MIKULÍK, L. HELFEN, P. PERNOT, M. ELLYAN, S. KELLER, T.M. KATONA, S.P. DENBAARS and J. SPECK. Microdiffraction imaging of dislocation densities in microstructured samples. Europhysics Letters. Paríž: European Physical Society, vol. 82, No 5, p. 56002-56006. ISSN 0295-5075. 2008.
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Basic information
Original name Microdiffraction imaging of dislocation densities in microstructured samples
Name in Czech Mikrodifrakční zobrazování hustoty dislokaci v mikrostrukturních vzorcích
Authors LÜBBERT, D. (276 Germany), T. BAUMBACH (276 Germany), Václav HOLÝ (203 Czech Republic), Petr MIKULÍK (203 Czech Republic, guarantor), L. HELFEN (276 Germany), P. PERNOT (203 Czech Republic), M. ELLYAN (275 Palestine, State of), S. KELLER (840 United States of America), T.M. KATONA (840 United States of America), S.P. DENBAARS (840 United States of America) and J. SPECK (840 United States of America).
Edition Europhysics Letters, Paríž, European Physical Society, 2008, 0295-5075.
Other information
Original language English
Type of outcome Article in a journal
Field of Study 10302 Condensed matter physics
Country of publisher United Kingdom of Great Britain and Northern Ireland
Confidentiality degree is not subject to a state or trade secret
WWW URL
Impact factor Impact factor: 2.203
RIV identification code RIV/00216224:14310/08:00026031
Organization unit Faculty of Science
UT WoS 000256301100016
Keywords in English X-ray diffraction; X-ray topography; Microdiffraction; Rocking curve imaging; Dislocations; GaN
Tags Dislocations, GaN, Microdiffraction, Rocking curve imaging, X-ray diffraction, X-ray topography
Tags International impact, Reviewed
Changed by Changed by: doc. RNDr. Petr Mikulík, Ph.D., učo 855. Changed: 10/7/2009 10:22.
Abstract
A full field X-ray microdiffraction technique is developed providing simultaneously both micrometer-resolved information of crystalline perfection as well as statistical information about the macroscopically illuminated sample. The method allows a detailed characterization of patterned substrates grown by epitaxial lateral overgrowth. Local wing tilts and their fluctuation over the sample area as well as the local and average number of grains in the wings are determined, and the reduction of threading dislocation densities in the grains of the ELO wings can be quantitatively estimated.
Abstract (in Czech)
Vyvinuli jsme rtg mikrodifrakční metodu, která umožňuje současně mikrometrové laterální rozlišení strukturní dokonalosti krystalu, stejně jako získání statické informace o makroskopicky ozářeném vzorku. Metoda dovoluje detailní charakterizaci tvarovaných substrátů pokrytých epitaxní vrstvou. Metoda umožňuje analyzovat lokální rozorientaci krystalitů a zrn na ozářené ploše vzorku a dále kvalitativně odhadnout hustotu dislokací v zrnech.
Links
MSM0021622410, plan (intention)Name: Fyzikální a chemické vlastnosti pokročilých materiálů a struktur
Investor: Ministry of Education, Youth and Sports of the CR, Physical and chemical properties of advanced materials and structures
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