KLAPETEK, Petr, Miroslav VALTR, Petr KLENOVSKÝ and Jiří BURŠÍK. Characterization of near field optical microscope probes. Surface and Interface Analysis. USA: John Wiley & Sons., 2008, vol. 40, No 1, p. 482-485. ISSN 0142-2421.
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Basic information
Original name Characterization of near field optical microscope probes
Name in Czech Charakterizace sond do mikroskopu blízkého pole
Authors KLAPETEK, Petr (203 Czech Republic, guarantor), Miroslav VALTR (203 Czech Republic), Petr KLENOVSKÝ (203 Czech Republic) and Jiří BURŠÍK (203 Czech Republic).
Edition Surface and Interface Analysis, USA, John Wiley & Sons. 2008, 0142-2421.
Other information
Original language English
Type of outcome Article in a journal
Field of Study 10306 Optics
Country of publisher Czech Republic
Confidentiality degree is not subject to a state or trade secret
Impact factor Impact factor: 1.272
RIV identification code RIV/00216224:14310/08:00025409
Organization unit Faculty of Science
UT WoS 000255486200079
Keywords in English near field scanning optical microscopy;image artefacts;optical analysis
Tags image artefacts, optical analysis
Tags International impact, Reviewed
Changed by Changed by: Mgr. Petr Klenovský, Ph.D., učo 105957. Changed: 21/11/2010 11:36.
Abstract
In this article the far-field radiation analysis of near-field optical probes is presented. It is shown that the quality of probes used for near-field scanning microscopy imaging can be estimated using directional measurements of the far-field radiation patterns. Experimental results are compared with numerical modeling of far-field radiation performed using finite difference in time-domain method (FDTD) and with SEM characterization of real probe geometry. The effects of probe geometry on real measurement on different samples are studied as well.
Links
FT-TA3/142, research and development projectName: Analýza optických vlastností solárních článků.
Investor: Ministry of Industry and Trade of the CR
PrintDisplayed: 26/4/2024 17:19