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@inproceedings{777827,
author = {Barnat, Jiří and Brim, Luboš and Edelkamp, Stefan and Sulewski, Damian and Šimeček, Pavel},
address = {L'Aquilla},
booktitle = {13th International Workshop on Formal Methods for Industrial Critical Systems (FMICS 2008)},
keywords = {I/O Model Checking; External Memory Algorithmics},
language = {eng},
location = {L'Aquilla},
pages = {159-174},
publisher = {ERCIM},
title = {Can Flash Memory Help in Model Checking?},
year = {2008}
}
TY - JOUR
ID - 777827
AU - Barnat, Jiří - Brim, Luboš - Edelkamp, Stefan - Sulewski, Damian - Šimeček, Pavel
PY - 2008
TI - Can Flash Memory Help in Model Checking?
PB - ERCIM
CY - L'Aquilla
KW - I/O Model Checking
KW - External Memory Algorithmics
N2 - As flash media become common and their capacities and speed grow, they are becoming a practical alternative for standard mechanical drives. So far, external memory model checking algorithms have been optimized for mechanical hard disks corresponding to the model of Aggarwal and Vitter~\cite{Aggarwal88}. Since flash memories are essentially different, the model of Aggarwal and Vitter no longer describes their typical behavior. On such a different device, algorithms can have different complexity, which may lead to the design of completely new flash-memory-efficient algorithms. We provide a model for computation of I/O complexity on the model of Aggarwal and Vitter modified for flash memories. We discuss verification algorithms optimized for this model and compare the performance of these algorithms with approaches known from I/O-efficient model checking on mechanical hard disks. We also give an answer, when the usage of flash devices pays off and whether their further evolution in speed and capacity could broaden a range, where new algorithms outperform the old ones.
ER -
BARNAT, Jiří, Luboš BRIM, Stefan EDELKAMP, Damian SULEWSKI and Pavel ŠIMEČEK. Can Flash Memory Help in Model Checking? In \textit{13th International Workshop on Formal Methods for Industrial Critical Systems (FMICS 2008)}. L'Aquilla: ERCIM, 2008, p.~159-174.
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