OHLÍDAL, Ivan, David NEČAS, Daniel FRANTA and Vilma BURŠÍKOVÁ. Characterization of non-uniform diamond-like carbon films by spectroscopic ellipsometry. Diamond and Related Materials. New York: Elsevier Science S.A., 2009, vol. 18, 2-3, p. 364-367. ISSN 0925-9635. Available from: https://dx.doi.org/10.1016/j.diamond.2008.09.003.
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Basic information
Original name Characterization of non-uniform diamond-like carbon films by spectroscopic ellipsometry
Name in Czech Charakterizace neuniformních vrstev diamantu-podobného uhlíku pomocí spektroskopické elipsometrie
Authors OHLÍDAL, Ivan (203 Czech Republic, guarantor, belonging to the institution), David NEČAS (203 Czech Republic, belonging to the institution), Daniel FRANTA (203 Czech Republic, belonging to the institution) and Vilma BURŠÍKOVÁ (203 Czech Republic, belonging to the institution).
Edition Diamond and Related Materials, New York, Elsevier Science S.A. 2009, 0925-9635.
Other information
Original language English
Type of outcome Article in a journal
Field of Study 10305 Fluids and plasma physics
Country of publisher Switzerland
Confidentiality degree is not subject to a state or trade secret
WWW URL
Impact factor Impact factor: 1.822
RIV identification code RIV/00216224:14310/09:00029162
Organization unit Faculty of Science
Doi http://dx.doi.org/10.1016/j.diamond.2008.09.003
UT WoS 000264429300060
Keywords (in Czech) diamantu podobné uhlíkové vrstvy; tloušťková neuniformita; materiálové paramtery; optické konstanty
Keywords in English diamond-like carbon films; thickness non-uniformity; material parameters; optical constants
Tags diamond-like carbon films, material parameters, optical constants, thickness non-uniformity
Tags International impact, Reviewed
Changed by Changed by: Mgr. Marie Šípková, DiS., učo 437722. Changed: 18/6/2020 15:47.
Abstract
In practice many films prepared using various technologies exhibit stronger or slighter area non-uniformity. Diamond-like carbon (DLC) films are also prepared with this non-uniformity sometimes. In this contribution will be shown how to take into account the thickness non-uniformity of the films when their optical characterization is carried out using spectrometric ellipsometry. Two new formulas expressing each of the three associated ellipsometric parameters, i.e. three components of the Stokes vector, of the films exhibiting thickness non-uniformity will be presented for phase modulated ellipsometry.
Abstract (in Czech)
V praxi řada vrstev připravených různými technologiemi vykazuje slabší či silnější plošnou neuniformitu. Diamantu-podobné uhlíkové (DLC) vrstvy jsou také někdy vyrobeny s touto neuniformitou. V tomto příspěvku bude ukázáno, jak zahrnout tloušťkovou neuniformitu vrstev při optické charakterizaci pomocí spektroskopické elispometrie. Jsou ukázány dva nové vzorce vyjadřující komponenty Stokesova vektoru vrstev vykazující tloušťkovou neuniformitu pro fázově modulovanou elipsometrii.
Links
GA202/07/1669, research and development projectName: Depozice termomechanicky stabilních nanostrukturovaných diamantu-podobných tenkých vrstev ve dvojfrekvenčních kapacitních výbojích
Investor: Czech Science Foundation, Deposition of thermomehanically stable nanostructured diamond-like thin films in dual frequency capacitive discharges
MSM0021622411, plan (intention)Name: Studium a aplikace plazmochemických reakcí v neizotermickém nízkoteplotním plazmatu a jeho interakcí s povrchem pevných látek
Investor: Ministry of Education, Youth and Sports of the CR, Study and application of plasma chemical reactions in non-isothermic low temperature plasma and its interaction with solid surface
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