NEČAS, David, Lenka ZAJÍČKOVÁ, Daniel FRANTA, Pavel SŤAHEL, Petr MIKULÍK, Mojmír MEDUŇA and Miroslav VALTR. Optical Characterization of Ultra-Thin Iron and Iron Oxide Films. e-Journal of Surface Science and Nanotechnology. Tokyo: The Surface Science Society of Japan, 2009, vol. 7, březen, p. 486-490. ISSN 1348-0391. |
Other formats:
BibTeX
LaTeX
RIS
@article{836841, author = {Nečas, David and Zajíčková, Lenka and Franta, Daniel and Sťahel, Pavel and Mikulík, Petr and Meduňa, Mojmír and Valtr, Miroslav}, article_location = {Tokyo}, article_number = {březen}, keywords = {iron; iron oxide; thin films; ellipsometry; spectrophotometry; X-ray reflection}, language = {eng}, issn = {1348-0391}, journal = {e-Journal of Surface Science and Nanotechnology}, title = {Optical Characterization of Ultra-Thin Iron and Iron Oxide Films}, volume = {7}, year = {2009} }
TY - JOUR ID - 836841 AU - Nečas, David - Zajíčková, Lenka - Franta, Daniel - Sťahel, Pavel - Mikulík, Petr - Meduňa, Mojmír - Valtr, Miroslav PY - 2009 TI - Optical Characterization of Ultra-Thin Iron and Iron Oxide Films JF - e-Journal of Surface Science and Nanotechnology VL - 7 IS - březen SP - 486-490 EP - 486-490 PB - The Surface Science Society of Japan SN - 13480391 KW - iron KW - iron oxide KW - thin films KW - ellipsometry KW - spectrophotometry KW - X-ray reflection N2 - Ultra-thin films of 57Fe deposited on silicon substrates and SiOxCyHz support layers and subsequently oxidized in laboratory atmosphere are studied by two optical methods: the combination of UV/VIS/NIR spectroscopic ellipsometry and spectrophotometry, used to find layer thicknesses and optical constants, and X-ray specular reflectometry, used to obtain the electron density depth profile. The results of both methods are compared and found to be in a relatively good agreement. ER -
NEČAS, David, Lenka ZAJÍČKOVÁ, Daniel FRANTA, Pavel SŤAHEL, Petr MIKULÍK, Mojmír MEDUŇA and Miroslav VALTR. Optical Characterization of Ultra-Thin Iron and Iron Oxide Films. \textit{e-Journal of Surface Science and Nanotechnology}. Tokyo: The Surface Science Society of Japan, 2009, vol.~7, březen, p.~486-490. ISSN~1348-0391.
|