Detailed Information on Publication Record
2010
Mapping the Local Density of States by Very-Low-Energy Scanning Electron Microscope
POKORNÁ, Zuzana and Luděk FRANKBasic information
Original name
Mapping the Local Density of States by Very-Low-Energy Scanning Electron Microscope
Authors
POKORNÁ, Zuzana and Luděk FRANK
Edition
Materials Transactions, Japonsko, The Japan Institute of Metals, 2010, 1345-9678
Other information
Language
English
Type of outcome
Článek v odborném periodiku
Field of Study
20201 Electrical and electronic engineering
Confidentiality degree
není předmětem státního či obchodního tajemství
References:
Impact factor
Impact factor: 0.787
Organization unit
Faculty of Science
UT WoS
000276538900004
Keywords in English
density of states; scanning low energy electron microscopy; aluminum; very-low-energy scanning electron microscopy; electron band structure
Změněno: 2/8/2010 16:28, Mgr. Zuzana Pokorná, Ph.D.
Abstract
V originále
Reflection of very slow electrons from solid surfaces has been reported to be inversely proportional to the local density of electronic states coupled to the incident electron wave. The reflected electron flux at units of eV used as the image signal in a scanning electron microscope allows mapping of the local density of states at high spatial resolution. Good performance of the microscope at very low energies is enabled by introducing the beam-retarding immersion lens (the cathode lens) with a biased specimen serving as the cathode. Results of demonstration experiments on aluminum are provided.
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