HOLÝ, Václav, Xavier MARTÍ, Lukáš HORÁK, Ondřej CAHA, Vít NOVÁK, Miroslav CUKR a Tobias Urs SCHÜLLI. Density of Mn interstitials in (Ga,Mn)As epitaxial layers determined by anomalous x-ray diffraction. Applied Physics Letters. USA: American Institute of Physics, 2010, roč. 97, č. 18, s. 181913-181915. ISSN 0003-6951. Dostupné z: https://dx.doi.org/10.1063/1.3514240. |
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@article{929699, author = {Holý, Václav and Martí, Xavier and Horák, Lukáš and Caha, Ondřej and Novák, Vít and Cukr, Miroslav and Schülli, Tobias Urs}, article_location = {USA}, article_number = {18}, doi = {http://dx.doi.org/10.1063/1.3514240}, keywords = {ferromagnetic semiconductos; anomal x-ray diffraction}, language = {eng}, issn = {0003-6951}, journal = {Applied Physics Letters}, title = {Density of Mn interstitials in (Ga,Mn)As epitaxial layers determined by anomalous x-ray diffraction}, url = {https://doi.org/10.1063/1.3514240}, volume = {97}, year = {2010} }
TY - JOUR ID - 929699 AU - Holý, Václav - Martí, Xavier - Horák, Lukáš - Caha, Ondřej - Novák, Vít - Cukr, Miroslav - Schülli, Tobias Urs PY - 2010 TI - Density of Mn interstitials in (Ga,Mn)As epitaxial layers determined by anomalous x-ray diffraction JF - Applied Physics Letters VL - 97 IS - 18 SP - 181913 EP - 181913 PB - American Institute of Physics SN - 00036951 KW - ferromagnetic semiconductos KW - anomal x-ray diffraction UR - https://doi.org/10.1063/1.3514240 L2 - https://doi.org/10.1063/1.3514240 N2 - Densities of Mn ions in epitaxial layers of (Ga,Mn)As were determined by anomalous x-ray diffraction, i.e., by a measurement of the dependence of the intensity of weak diffraction 002 on the photon energy around the MnK absorption edge. From the measured data it was possible to determine the density of Mn ions in substitutional positions and the difference in the Mn densities in two possible interstitial positions in the GaAs lattice. The data confirm the previous finding that the density of Mn interstitials in centers of Ga tetrahedrons decrease during post-growth annealing. ER -
HOLÝ, Václav, Xavier MARTÍ, Lukáš HORÁK, Ondřej CAHA, Vít NOVÁK, Miroslav CUKR a Tobias Urs SCHÜLLI. Density of Mn interstitials in (Ga,Mn)As epitaxial layers determined by anomalous x-ray diffraction. \textit{Applied Physics Letters}. USA: American Institute of Physics, 2010, roč.~97, č.~18, s.~181913-181915. ISSN~0003-6951. Dostupné z: https://dx.doi.org/10.1063/1.3514240.
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