| HOLÝ, Václav, Xavier MARTÍ, Lukáš HORÁK, Ondřej CAHA, Vít NOVÁK, Miroslav CUKR and Tobias Urs SCHÜLLI. Density of Mn interstitials in (Ga,Mn)As epitaxial layers determined by anomalous x-ray diffraction. Applied Physics Letters. USA: American Institute of Physics, 2010, vol. 97, No 18, p. 181913-181915. ISSN 0003-6951. Available from: https://dx.doi.org/10.1063/1.3514240. |
Other formats:
BibTeX
LaTeX
RIS
@article{929699,
author = {Holý, Václav and Martí, Xavier and Horák, Lukáš and Caha, Ondřej and Novák, Vít and Cukr, Miroslav and Schülli, Tobias Urs},
article_location = {USA},
article_number = {18},
doi = {http://dx.doi.org/10.1063/1.3514240},
keywords = {ferromagnetic semiconductos; anomal x-ray diffraction},
language = {eng},
issn = {0003-6951},
journal = {Applied Physics Letters},
title = {Density of Mn interstitials in (Ga,Mn)As epitaxial layers determined by anomalous x-ray diffraction},
url = {https://doi.org/10.1063/1.3514240},
volume = {97},
year = {2010}
}
TY - JOUR
ID - 929699
AU - Holý, Václav - Martí, Xavier - Horák, Lukáš - Caha, Ondřej - Novák, Vít - Cukr, Miroslav - Schülli, Tobias Urs
PY - 2010
TI - Density of Mn interstitials in (Ga,Mn)As epitaxial layers determined by anomalous x-ray diffraction
JF - Applied Physics Letters
VL - 97
IS - 18
SP - 181913
EP - 181913
PB - American Institute of Physics
SN - 00036951
KW - ferromagnetic semiconductos
KW - anomal x-ray diffraction
UR - https://doi.org/10.1063/1.3514240
L2 - https://doi.org/10.1063/1.3514240
N2 - Densities of Mn ions in epitaxial layers of (Ga,Mn)As were determined by anomalous x-ray diffraction, i.e., by a measurement of the dependence of the intensity of weak diffraction 002 on the photon energy around the MnK absorption edge. From the measured data it was possible to determine the density of Mn ions in substitutional positions and the difference in the Mn densities in two possible interstitial positions in the GaAs lattice. The data confirm the previous finding that the density of Mn interstitials in centers of Ga tetrahedrons decrease during post-growth annealing.
ER -
HOLÝ, Václav, Xavier MARTÍ, Lukáš HORÁK, Ondřej CAHA, Vít NOVÁK, Miroslav CUKR and Tobias Urs SCHÜLLI. Density of Mn interstitials in (Ga,Mn)As epitaxial layers determined by anomalous x-ray diffraction. \textit{Applied Physics Letters}. USA: American Institute of Physics, 2010, vol.~97, No~18, p.~181913-181915. ISSN~0003-6951. Available from: https://dx.doi.org/10.1063/1.3514240.
|
