| ISIC, Goran, Milka JAKOVLJEVIC, Marko FILIPOVIC, Djordje JOVANOVIC, Borislav VASIC, Sasa LAZOVIC, Nevena PUAC, Zoran PETROVIC, Radmila KOSTIC, Rados GAJIC, Josef HUMLÍČEK, Maria LOSURDO, Giovanni BRUNO, Iris BERGMAIR and Kurt HINGERLT. Spectroscopic ellipsometry of few-layer graphene. Journal of Nanophotonics. Bellingham, USA: SPIE, 2011, vol. 5, No 1, p. 1-7. ISSN 1934-2608. Available from: https://dx.doi.org/10.1117/1.3598162. |
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@article{951025,
author = {Isic, Goran and Jakovljevic, Milka and Filipovic, Marko and Jovanovic, Djordje and Vasic, Borislav and Lazovic, Sasa and Puac, Nevena and Petrovic, Zoran and Kostic, Radmila and Gajic, Rados and Humlíček, Josef and Losurdo, Maria and Bruno, Giovanni and Bergmair, Iris and Hingerlt, Kurt},
article_location = {Bellingham, USA},
article_number = {1},
doi = {http://dx.doi.org/10.1117/1.3598162},
keywords = {graphene; ellipsometry; island film model},
language = {eng},
issn = {1934-2608},
journal = {Journal of Nanophotonics},
title = {Spectroscopic ellipsometry of few-layer graphene},
volume = {5},
year = {2011}
}
TY - JOUR
ID - 951025
AU - Isic, Goran - Jakovljevic, Milka - Filipovic, Marko - Jovanovic, Djordje - Vasic, Borislav - Lazovic, Sasa - Puac, Nevena - Petrovic, Zoran - Kostic, Radmila - Gajic, Rados - Humlíček, Josef - Losurdo, Maria - Bruno, Giovanni - Bergmair, Iris - Hingerlt, Kurt
PY - 2011
TI - Spectroscopic ellipsometry of few-layer graphene
JF - Journal of Nanophotonics
VL - 5
IS - 1
SP - 1-7
EP - 1-7
PB - SPIE
SN - 19342608
KW - graphene
KW - ellipsometry
KW - island film model
N2 - The optical properties of few-layer graphene (FLG) films were measured in the ultraviolet and visible spectrum using a spectroscopic ellipsometer equipped with a 50-mu m nominal microspot size. The FLG thickness was found by atomic force microscopy. Measurements revealed that the microspot is larger than the FLG flake. The ellipsometric data was interpreted using the island-film model. Comparison with graphite and recently published graphene data showed reasonable agreement, but with some features that could not be explained. The error margin for the optical constants was estimated to be +/- 10%.
ER -
ISIC, Goran, Milka JAKOVLJEVIC, Marko FILIPOVIC, Djordje JOVANOVIC, Borislav VASIC, Sasa LAZOVIC, Nevena PUAC, Zoran PETROVIC, Radmila KOSTIC, Rados GAJIC, Josef HUMLÍČEK, Maria LOSURDO, Giovanni BRUNO, Iris BERGMAIR and Kurt HINGERLT. Spectroscopic ellipsometry of few-layer graphene. \textit{Journal of Nanophotonics}. Bellingham, USA: SPIE, 2011, vol.~5, No~1, p.~1-7. ISSN~1934-2608. Available from: https://dx.doi.org/10.1117/1.3598162.
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