ISIC, Goran, Milka JAKOVLJEVIC, Marko FILIPOVIC, Djordje JOVANOVIC, Borislav VASIC, Sasa LAZOVIC, Nevena PUAC, Zoran PETROVIC, Radmila KOSTIC, Rados GAJIC, Josef HUMLÍČEK, Maria LOSURDO, Giovanni BRUNO, Iris BERGMAIR a Kurt HINGERLT. Spectroscopic ellipsometry of few-layer graphene. Journal of Nanophotonics. Bellingham, USA: SPIE, 2011, roč. 5, č. 1, s. 1-7. ISSN 1934-2608. Dostupné z: https://dx.doi.org/10.1117/1.3598162. |
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@article{951025, author = {Isic, Goran and Jakovljevic, Milka and Filipovic, Marko and Jovanovic, Djordje and Vasic, Borislav and Lazovic, Sasa and Puac, Nevena and Petrovic, Zoran and Kostic, Radmila and Gajic, Rados and Humlíček, Josef and Losurdo, Maria and Bruno, Giovanni and Bergmair, Iris and Hingerlt, Kurt}, article_location = {Bellingham, USA}, article_number = {1}, doi = {http://dx.doi.org/10.1117/1.3598162}, keywords = {graphene; ellipsometry; island film model}, language = {eng}, issn = {1934-2608}, journal = {Journal of Nanophotonics}, title = {Spectroscopic ellipsometry of few-layer graphene}, volume = {5}, year = {2011} }
TY - JOUR ID - 951025 AU - Isic, Goran - Jakovljevic, Milka - Filipovic, Marko - Jovanovic, Djordje - Vasic, Borislav - Lazovic, Sasa - Puac, Nevena - Petrovic, Zoran - Kostic, Radmila - Gajic, Rados - Humlíček, Josef - Losurdo, Maria - Bruno, Giovanni - Bergmair, Iris - Hingerlt, Kurt PY - 2011 TI - Spectroscopic ellipsometry of few-layer graphene JF - Journal of Nanophotonics VL - 5 IS - 1 SP - 1-7 EP - 1-7 PB - SPIE SN - 19342608 KW - graphene KW - ellipsometry KW - island film model N2 - The optical properties of few-layer graphene (FLG) films were measured in the ultraviolet and visible spectrum using a spectroscopic ellipsometer equipped with a 50-mu m nominal microspot size. The FLG thickness was found by atomic force microscopy. Measurements revealed that the microspot is larger than the FLG flake. The ellipsometric data was interpreted using the island-film model. Comparison with graphite and recently published graphene data showed reasonable agreement, but with some features that could not be explained. The error margin for the optical constants was estimated to be +/- 10%. ER -
ISIC, Goran, Milka JAKOVLJEVIC, Marko FILIPOVIC, Djordje JOVANOVIC, Borislav VASIC, Sasa LAZOVIC, Nevena PUAC, Zoran PETROVIC, Radmila KOSTIC, Rados GAJIC, Josef HUMLÍČEK, Maria LOSURDO, Giovanni BRUNO, Iris BERGMAIR a Kurt HINGERLT. Spectroscopic ellipsometry of few-layer graphene. \textit{Journal of Nanophotonics}. Bellingham, USA: SPIE, 2011, roč.~5, č.~1, s.~1-7. ISSN~1934-2608. Dostupné z: https://dx.doi.org/10.1117/1.3598162.
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