Detailed Information on Publication Record
2011
Oxygen precipitation studied by x-ray diffraction techniques
MEDUŇA, Mojmír, Ondřej CAHA, Jiří RŮŽIČKA, Silvie BERNATOVÁ, Milan SVOBODA et. al.Basic information
Original name
Oxygen precipitation studied by x-ray diffraction techniques
Authors
MEDUŇA, Mojmír (203 Czech Republic, guarantor, belonging to the institution), Ondřej CAHA (203 Czech Republic, belonging to the institution), Jiří RŮŽIČKA (203 Czech Republic, belonging to the institution), Silvie BERNATOVÁ (203 Czech Republic, belonging to the institution), Milan SVOBODA (203 Czech Republic) and Jiří BURŠÍK (203 Czech Republic)
Edition
Solid State Phenomena, Trans Tech Publications, 2011, 1012-0394
Other information
Language
English
Type of outcome
Článek v odborném periodiku
Field of Study
10302 Condensed matter physics
Country of publisher
Switzerland
Confidentiality degree
není předmětem státního či obchodního tajemství
Impact factor
Impact factor: 0.493 in 2005
RIV identification code
RIV/00216224:14740/11:00050319
Organization unit
Central European Institute of Technology
UT WoS
000303356300052
Keywords (in Czech)
Czochralského křemík; kyslíkové precipitáty; rtg Laueho difrakce
Keywords in English
Czochralski silicon; oxygen precipitates; x-ray Laue diffraction
Tags
Tags
International impact, Reviewed
Změněno: 4/4/2014 17:15, Mgr. Mojmír Meduňa, Ph.D.
V originále
We report on study of oxygen precipitates grown in Czochralski silicon wafers investigated by x-ray diffraction in Bragg reflection geometry and Laue transmission geometry.
In Czech
Cílem práce bylo studium kyslíkových precipitátů vyrostlých uvnitř desek Czochralského křemíku pomocí rtg difrakce v Braggově a Laueho geometrii na průchod.
Links
ED1.1.00/02.0068, research and development project |
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GA202/09/1013, research and development project |
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GP202/09/P410, research and development project |
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MSM0021622410, plan (intention) |
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MUNI/A/1047/2009, interní kód MU |
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