Masaryk University

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    1998

    1. Depth inhomogeneity of deposited thin films: application to semi-insulating polycrystalline silicon films
      KUČÍRKOVÁ, Assja, Karel NAVRÁTIL and J. ZEMEK. Depth inhomogeneity of deposited thin films: application to semi-insulating polycrystalline silicon films. Thin Solid Films. UK Oxford: Elsevier science, 1998, (323)1998, -, p. 53-58. ISSN 0040-6090.
      More: https://is.muni.cz/publication/200299/en

    1996

    1. Influence of Oxygen Concentration on Optical Properties of Semi-insulating Polycrystalline Silicon Films
      KUČÍRKOVÁ, Assja and Karel NAVRÁTIL. Influence of Oxygen Concentration on Optical Properties of Semi-insulating Polycrystalline Silicon Films. Appl. Phys. A. Springer-Verlag, 1996, vol. 1996, A63, p. 495-503.
      More: https://is.muni.cz/publication/197473/en

    1994

    1. Interpretation of infrared transmittance spectra of SiO 2 thin films
      KUČÍRKOVÁ, Assja and Karel NAVRÁTIL. Interpretation of infrared transmittance spectra of SiO 2 thin films. Applied Spectroscopy. USA: Society Appl. Spectroscopy, 1994, 48(1994), No 1, p. 113-120. ISSN 0003-7028.
      More: https://is.muni.cz/publication/197041/en
    2. Undesirable Occurrence of the Interference Fringes in IR Transmittance Spectra
      KUČÍRKOVÁ, Assja and Karel NAVRÁTIL. Undesirable Occurrence of the Interference Fringes in IR Transmittance Spectra. Scripta Fac.Brun. 1994, 29(1994), No 1, p. -, -. ISSN 2101-2986.
      More: https://is.muni.cz/publication/197042/en
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