česky | in English
Name (in English): Depth inhomogeneity of deposited thin films: application to semi-insulating polycrystalline silicon films
RIV: Article in a journal. Solid-state physics and magnetism. English. United Kingdom of Great Britain and Northern Ireland.
Keywords in English: thin films
Changed by: doc. RNDr. Assja Kučírková, CSc., učo 2493. Changed: 18/4/2000 09:56.
Name (in English): Influence of Oxygen Concentration on Optical Properties of Semi-insulating Polycrystalline Silicon Films
RIV/00216224:14310/96:00000023 Article in a journal. Theoretical physics. English. Germany.
Changed by: doc. RNDr. Assja Kučírková, CSc., učo 2493. Changed: 18/4/2000 10:01.
Name (in English): Interpretation of infrared transmittance spectra of SiO 2 thin films
RIV/00216224:14310/94:00000288 Article in a journal. Solid-state physics and magnetism. English. United States of America.
Changed by: doc. RNDr. Assja Kučírková, CSc., učo 2493. Changed: 20/5/1999 10:25.
Name (in English): Undesirable Occurrence of the Interference Fringes in IR Transmittance Spectra
RIV/00216224:14310/94:00000013 Article in a journal. Solid-state physics and magnetism. English. Czech Republic.
Changed by: doc. RNDr. Assja Kučírková, CSc., učo 2493. Changed: 18/4/2000 10:05.