Výpis publikací

ČERMÁK, Martin, Štěpánka KELAROVÁ, Jana JURMANOVÁ, Pavlína KÜHROVÁ a Vilma BURŠÍKOVÁ. The wide range optical spectrum characterization of the silicon and oxygen doped diamond like carbon inhomogeneous thin films. Diamond and Related Materials. Elsevier Ltd, 2022, roč. 128, October 2022, s. 1-16. ISSN 0925-9635. Dostupné z: https://dx.doi.org/10.1016/j.diamond.2022.109245.

OHLÍDAL, Ivan, Jiří VOHÁNKA a Martin ČERMÁK. Optics of Inhomogeneous Thin Films with Defects: Application to Optical Characterization. Coatings. Basel: MDPI, 2021, roč. 11, č. 1, s. 22-52. ISSN 2079-6412. Dostupné z: https://dx.doi.org/10.3390/coatings11010022.

KELAROVÁ, Štěpánka, Roman PŘIBYL, Vojtěch HOMOLA, Lukáš ZÁBRANSKÝ, Monika STUPAVSKÁ, Martin ČERMÁK a Vilma BURŠÍKOVÁ. A comparative study of sioxcyhz thin films deposited in trimethysilyl ACETATE/O2/Ar plasmas. Online. In 11th International Conference on Nanomaterials - Research & Application (NANOCON 2019). Ostrava: TANGER Ltd, 2020, s. 657-662. ISBN 978-80-87294-95-6. Dostupné z: https://dx.doi.org/10.37904/nanocon.2019.8643.

KELAROVÁ, Štěpánka, Vojtěch HOMOLA, Monika STUPAVSKÁ, Martin ČERMÁK, Jiří VOHÁNKA, Roman PŘIBYL, Lukáš ZÁBRANSKÝ a Vilma BURŠÍKOVÁ. Deposition of organosilicon coatings from trimethylsilyl acetate and oxygen gases in capacitively coupled RF glow discharge. Progress in Organic Coatings. Lausanne: Elsevier, 2020, roč. 149, December 2020, s. 1-8. ISSN 0300-9440. Dostupné z: https://dx.doi.org/10.1016/j.porgcoat.2020.105927.

VOHÁNKA, Jiří, Štěpán ŠUSTEK, Vilma BURŠÍKOVÁ, Veronika ŠKLÍBOVÁ, Václav ŠULC, Vojtěch HOMOLA, Daniel FRANTA, Martin ČERMÁK, Miloslav OHLÍDAL a Ivan OHLÍDAL. Determining shape of thickness non-uniformity using variable-angle spectroscopic ellipsometry. Applied Surface Science. Elsevier Science, 2020, roč. 534, December 2020, s. 1-10. ISSN 0169-4332. Dostupné z: https://dx.doi.org/10.1016/j.apsusc.2020.147625.

VOHÁNKA, Jiří, Daniel FRANTA, Martin ČERMÁK, Vojtěch HOMOLA, Vilma BURŠÍKOVÁ a Ivan OHLÍDAL. Ellipsometric characterization of highly non-uniform thin films with the shape of thickness non-uniformity modeled by polynomials. Optics Express. Washington, D.C.: Optical Society of America, 2020, roč. 28, č. 4, s. 5492-5506. ISSN 1094-4087. Dostupné z: https://dx.doi.org/10.1364/OE.380657.

ČERMÁK, Martin, Jiří VOHÁNKA, Daniel FRANTA a Ivan OHLÍDAL. Optical quantities of a multilayer system with randomly rough boundaries and uniaxial anisotropic media calculated using the Rayleigh-Rice theory and Yeh matrix formalism. Physica Scripta. Royal Swedish Academy of Sciences, 2020, roč. 95, č. 9, s. 095503-95521. ISSN 0031-8949. Dostupné z: https://dx.doi.org/10.1088/1402-4896/aba77b.

OHLÍDAL, Ivan, Jiří VOHÁNKA, Vilma BURŠÍKOVÁ, Daniel FRANTA a Martin ČERMÁK. Spectroscopic ellipsometry of inhomogeneous thin films exhibiting thickness non-uniformity and transition layers. Optics Express. Washington, D.C.: OPTICAL SOC AMER, 2020, roč. 28, č. 1, s. 160-174. ISSN 1094-4087. Dostupné z: https://dx.doi.org/10.1364/OE.28.000160.

OHLÍDAL, Ivan, Jiří VOHÁNKA, Daniel FRANTA, Martin ČERMÁK, Jaroslav ŽENÍŠEK a Petr VAŠINA. Approximate methods for the optical characterization of inhomogeneous thin films: Applications to silicon nitride films. Journal of Electrical Engineering. Slovenská technická univezita v Bratislavě, 2019, roč. 70, č. 7, s. 16-26. ISSN 1335-3632. Dostupné z: https://dx.doi.org/10.2478/jee-2019-0037.

OHLÍDAL, Ivan, Jiří VOHÁNKA, Jan MISTRÍK, Martin ČERMÁK, František VIŽĎA a Daniel FRANTA. Approximations of reflection and transmission coefficients of inhomogeneous thin films based on multiple-beam interference model. Thin Solid Films. Elsevier, 2019, roč. 692, 31 December 2019, s. 1-17. ISSN 0040-6090. Dostupné z: https://dx.doi.org/10.1016/j.tsf.2019.03.001.

OHLÍDAL, Ivan, Jiří VOHÁNKA, Martin ČERMÁK a Daniel FRANTA. Combination of spectroscopic ellipsometry and spectroscopic reflectometry with including light scattering in the optical characterization of randomly rough silicon surfaces covered by native oxide layers. Surface Topography: Metrology and Properties. BRISTOL: OP PUBLISHING LTD, 2019, roč. 7, č. 4, s. 1-12. ISSN 2051-672X. Dostupné z: https://dx.doi.org/10.1088/2051-672x/ab359d.

VOHÁNKA, Jiří, Martin ČERMÁK, Daniel FRANTA a Ivan OHLÍDAL. Efficient method to calculate the optical quantities of multi-layer systems with randomly rough boundaries using the Rayleigh Rice theory. Physica Scripta. Bristol: IOP Publishing Ltd., 2019, roč. 94, č. 4, s. 1-22. ISSN 0031-8949. Dostupné z: https://dx.doi.org/10.1088/1402-4896/aafbc1.

OHLÍDAL, Ivan, Jiří VOHÁNKA, Vilma BURŠÍKOVÁ, Jaroslav ŽENÍŠEK, Petr VAŠINA, Martin ČERMÁK a Daniel FRANTA. Optical characterization of inhomogeneous thin films containing transition layers using the combined method of spectroscopic ellipsometry and spectroscopic reflectometry based on multiple-beam interference model. Journal of Vacuum Science and Technology B:Nanotechnology and Microelectronics. 2019, roč. 37, č. 6, s. "062921-1"-"062921-10", 10 s. ISSN 2166-2746. Dostupné z: https://dx.doi.org/10.1116/1.5122014.

VOHÁNKA, Jiří, Ivan OHLÍDAL, Miloslav OHLÍDAL, Štěpán ŠUSTEK, Martin ČERMÁK, Václav ŠULC, Petr VAŠINA, Jaroslav ŽENÍŠEK a Daniel FRANTA. Optical Characterization of Non-Stoichiometric Silicon Nitride Films Exhibiting Combined Defects. Coatings. Basel: MDPI, 2019, roč. 9, č. 7, s. 1-21. ISSN 2079-6412. Dostupné z: https://dx.doi.org/10.3390/coatings9070416.

FRANTA, Daniel, Jiří VOHÁNKA, Martin BRÁNECKÝ, Pavel FRANTA, Martin ČERMÁK, Ivan OHLÍDAL a Vladimír ČECH. Optical properties of the crystalline silicon wafers described using the universal dispersion model. Journal of Vacuum Science & Technology B. New York: A V S AMER INST PHYSICS, 2019, roč. 37, č. 6, s. "062907-1"-"062907-14", 14 s. ISSN 2166-2746. Dostupné z: https://dx.doi.org/10.1116/1.5122284.

FRANTA, Daniel, Jiří VOHÁNKA, Martin ČERMÁK, Pavel FRANTA a Ivan OHLÍDAL. Temperature dependent dispersion models applicable in solid state physics. Journal of Electrical Engineering. Slovenská technická univezita v Bratislavě, 2019, roč. 70, č. 7, s. 1-15. ISSN 1335-3632. Dostupné z: https://dx.doi.org/10.2478/jee-2019-0036.

FRANTA, Daniel, Pavel FRANTA, Jiří VOHÁNKA, Martin ČERMÁK a Ivan OHLÍDAL. Determination of thicknesses and temperatures of crystalline silicon wafers from optical measurements in the far infrared region. Journal of Applied Physics. 2018, roč. 123, č. 18, s. 185707-185717. ISSN 0021-8979. Dostupné z: https://dx.doi.org/10.1063/1.5026195.

OHLÍDAL, Ivan, Jiří VOHÁNKA, Jan MISTRÍK, Martin ČERMÁK a Daniel FRANTA. Different theoretical approaches at optical characterization of randomly rough silicon surfaces covered with native oxide layers. Surface and Interface Analysis. Wiley, 2018, roč. 50, č. 11, s. 1230-1233. ISSN 0142-2421. Dostupné z: https://dx.doi.org/10.1002/sia.6463.

OHLÍDAL, Ivan, Jiří VOHÁNKA, Martin ČERMÁK a Daniel FRANTA. Ellipsometry of Layered Systems. In Olaf Stenzel, Miloslav Ohlídal. Optical Characterization of Thin Solid Films. Cham: Springer, 2018, s. 233-267. Springer Series in Surface Sciences, volume 64. ISBN 978-3-319-75324-9. Dostupné z: https://dx.doi.org/10.1007/978-3-319-75325-6_9.

OHLÍDAL, Ivan, Martin ČERMÁK a Jiří VOHÁNKA. Optical Characterization of Thin Films Exhibiting Defects. In Olaf Stenzel, Miloslav Ohlídal. Optical Characterization of Thin Solid Films. Cham: Springer, 2018, s. 271-313. Springer Series in Surface Sciences, volume 64. ISBN 978-3-319-75324-9. Dostupné z: https://dx.doi.org/10.1007/978-3-319-75325-6_10.

ČERMÁK, Martin, Jiří VOHÁNKA, Ivan OHLÍDAL a Daniel FRANTA. Optical quantities of multi-layer systems with randomly rough boundaries calculated using the exact approach of the Rayleigh–Rice theory. Journal of modern optics. Taylor & Francis, 2018, roč. 65, č. 14, s. 1720-1736. ISSN 0950-0340. Dostupné z: https://dx.doi.org/10.1080/09500340.2018.1457187.

FRANTA, Daniel, Jiří VOHÁNKA a Martin ČERMÁK. Universal Dispersion Model for Characterization of Thin Films Over Wide Spectral Range. In Olaf Stenzel, Miloslav Ohlídal. Optical Characterization of Thin Solid Films. Cham: Springer, 2018, s. 31-82. Springer Series in Surface Sciences, volume 64. ISBN 978-3-319-75324-9. Dostupné z: https://dx.doi.org/10.1007/978-3-319-75325-6_3.

VOHÁNKA, Jiří, Ivan OHLÍDAL, Jaroslav ŽENÍŠEK, Petr VAŠINA, Martin ČERMÁK a Daniel FRANTA. Use of the Richardson extrapolation in optics of inhomogeneous layers: Application to optical characterization. Surface and Interface Analysis. Wiley, 2018, roč. 50, č. 7, s. 757-765. ISSN 0142-2421. Dostupné z: https://dx.doi.org/10.1002/sia.6473.

FRANTA, Daniel, Martin ČERMÁK, Jiří VOHÁNKA a Ivan OHLÍDAL. Dispersion models describing interband electronic transitions combining Tauc's law and Lorentz model. Thin Solid Films. LAUSANNE, SWITZERLAND: ELSEVIER SCIENCE SA, 2017, roč. 631, June, s. 12-22. ISSN 0040-6090. Dostupné z: https://dx.doi.org/10.1016/j.tsf.2017.03.051.

OHLÍDAL, Ivan, Jiří VOHÁNKA, Martin ČERMÁK a Daniel FRANTA. Optical characterization of randomly microrough surfaces covered with very thin overlayers using effective medium approximation and Rayleigh-Rice theory. Applied Surface Science. AMSTERDAM: Elsevier Science, 2017, roč. 419, October, s. 942-956. ISSN 0169-4332. Dostupné z: https://dx.doi.org/10.1016/j.apsusc.2017.04.211.

ČERMÁK, Martin a Martin ZOUHAR. Cosmologically inspired Kastor-Traschen solution. In 10th Vienna Central European Seminar on Particle Physics and Quantum Field Theory. 2014.

ČERMÁK, Martin a Martin ZOUHAR. Cosmologically inspired Kastor-Traschen solution. Physical review D. 2014, roč. 89, č. 8, s. "neuvedeno", 15 s. ISSN 1550-7998. Dostupné z: https://dx.doi.org/10.1103/PhysRevD.89.084024.

ČERMÁK, Martin a Martin ZOUHAR. Thin Static Charged Dust Majumdar–Papapetrou Shells with High Symmetry in D>=4. International Journal of Theoretical Physics. Springer, 2012, roč. 51, č. 8, s. 2455-2469. ISSN 0020-7748. Dostupné z: https://dx.doi.org/10.1007/s10773-012-1126-6.

ČERMÁK, Martin, L. HAVLÍČEK a Martin ZOUHAR. Tensile stress and penetration test of the Red Haven peaches skin. Acta Universitatis Agriculturae et Silviculturae Mendelianae Brunensis. Brno: Mendelova zem. a les. univerzita, 2011, roč. 59, č. 1, s. 23-28. ISSN 1211-8516.

ČERMÁK, Martin, Pavel SŤAHEL, Vilma BURŠÍKOVÁ, Zdeněk NAVRÁTIL a David TRUNEC. Depozice hydrofobních polymerových vrstev v povrchovém barierovém výboji za atmosfericlého tlaku. In Sborník Juniormat'03 4th International Conference. 1st. Brno: Faculty of Mechanical Engineering, BUT, 2003, s. 264-265. ISBN 80-214-2462-1.