Publication Records

ČERMÁK, Martin, Štěpánka KELAROVÁ, Jana JURMANOVÁ, Pavlína KÜHROVÁ and Vilma BURŠÍKOVÁ. The wide range optical spectrum characterization of the silicon and oxygen doped diamond like carbon inhomogeneous thin films. Diamond and Related Materials. Elsevier Ltd, 2022, vol. 128, October 2022, p. 1-16. ISSN 0925-9635. Available from: https://dx.doi.org/10.1016/j.diamond.2022.109245.

OHLÍDAL, Ivan, Jiří VOHÁNKA and Martin ČERMÁK. Optics of Inhomogeneous Thin Films with Defects: Application to Optical Characterization. Coatings. Basel: MDPI, 2021, vol. 11, No 1, p. 22-52. ISSN 2079-6412. Available from: https://dx.doi.org/10.3390/coatings11010022.

KELAROVÁ, Štěpánka, Roman PŘIBYL, Vojtěch HOMOLA, Lukáš ZÁBRANSKÝ, Monika STUPAVSKÁ, Martin ČERMÁK and Vilma BURŠÍKOVÁ. A comparative study of sioxcyhz thin films deposited in trimethysilyl ACETATE/O2/Ar plasmas. Online. In 11th International Conference on Nanomaterials - Research & Application (NANOCON 2019). Ostrava: TANGER Ltd, 2020, p. 657-662. ISBN 978-80-87294-95-6. Available from: https://dx.doi.org/10.37904/nanocon.2019.8643.

KELAROVÁ, Štěpánka, Vojtěch HOMOLA, Monika STUPAVSKÁ, Martin ČERMÁK, Jiří VOHÁNKA, Roman PŘIBYL, Lukáš ZÁBRANSKÝ and Vilma BURŠÍKOVÁ. Deposition of organosilicon coatings from trimethylsilyl acetate and oxygen gases in capacitively coupled RF glow discharge. Progress in Organic Coatings. Lausanne: Elsevier, 2020, vol. 149, December 2020, p. 1-8. ISSN 0300-9440. Available from: https://dx.doi.org/10.1016/j.porgcoat.2020.105927.

VOHÁNKA, Jiří, Štěpán ŠUSTEK, Vilma BURŠÍKOVÁ, Veronika ŠKLÍBOVÁ, Václav ŠULC, Vojtěch HOMOLA, Daniel FRANTA, Martin ČERMÁK, Miloslav OHLÍDAL and Ivan OHLÍDAL. Determining shape of thickness non-uniformity using variable-angle spectroscopic ellipsometry. Applied Surface Science. Elsevier Science, 2020, vol. 534, December 2020, p. 1-10. ISSN 0169-4332. Available from: https://dx.doi.org/10.1016/j.apsusc.2020.147625.

VOHÁNKA, Jiří, Daniel FRANTA, Martin ČERMÁK, Vojtěch HOMOLA, Vilma BURŠÍKOVÁ and Ivan OHLÍDAL. Ellipsometric characterization of highly non-uniform thin films with the shape of thickness non-uniformity modeled by polynomials. Optics Express. Washington, D.C.: Optical Society of America, 2020, vol. 28, No 4, p. 5492-5506. ISSN 1094-4087. Available from: https://dx.doi.org/10.1364/OE.380657.

ČERMÁK, Martin, Jiří VOHÁNKA, Daniel FRANTA and Ivan OHLÍDAL. Optical quantities of a multilayer system with randomly rough boundaries and uniaxial anisotropic media calculated using the Rayleigh-Rice theory and Yeh matrix formalism (Optical quantities of a multilayer system with randomly rough boundaries and uniaxial anisotropic media calculated using the Rayleigh–Rice theory and Yeh matrix formalism). Physica Scripta. Royal Swedish Academy of Sciences, 2020, vol. 95, No 9, p. 095503-95521. ISSN 0031-8949. Available from: https://dx.doi.org/10.1088/1402-4896/aba77b.

OHLÍDAL, Ivan, Jiří VOHÁNKA, Vilma BURŠÍKOVÁ, Daniel FRANTA and Martin ČERMÁK. Spectroscopic ellipsometry of inhomogeneous thin films exhibiting thickness non-uniformity and transition layers. Optics Express. Washington, D.C.: OPTICAL SOC AMER, 2020, vol. 28, No 1, p. 160-174. ISSN 1094-4087. Available from: https://dx.doi.org/10.1364/OE.28.000160.

OHLÍDAL, Ivan, Jiří VOHÁNKA, Daniel FRANTA, Martin ČERMÁK, Jaroslav ŽENÍŠEK and Petr VAŠINA. Approximate methods for the optical characterization of inhomogeneous thin films: Applications to silicon nitride films. Journal of Electrical Engineering. Slovenská technická univezita v Bratislavě, 2019, vol. 70, No 7, p. 16-26. ISSN 1335-3632. Available from: https://dx.doi.org/10.2478/jee-2019-0037.

OHLÍDAL, Ivan, Jiří VOHÁNKA, Jan MISTRÍK, Martin ČERMÁK, František VIŽĎA and Daniel FRANTA. Approximations of reflection and transmission coefficients of inhomogeneous thin films based on multiple-beam interference model. Thin Solid Films. Elsevier, 2019, vol. 692, 31 December 2019, p. 1-17. ISSN 0040-6090. Available from: https://dx.doi.org/10.1016/j.tsf.2019.03.001.

OHLÍDAL, Ivan, Jiří VOHÁNKA, Martin ČERMÁK and Daniel FRANTA. Combination of spectroscopic ellipsometry and spectroscopic reflectometry with including light scattering in the optical characterization of randomly rough silicon surfaces covered by native oxide layers. Surface Topography: Metrology and Properties. BRISTOL: OP PUBLISHING LTD, 2019, vol. 7, No 4, p. 1-12. ISSN 2051-672X. Available from: https://dx.doi.org/10.1088/2051-672x/ab359d.

VOHÁNKA, Jiří, Martin ČERMÁK, Daniel FRANTA and Ivan OHLÍDAL. Efficient method to calculate the optical quantities of multi-layer systems with randomly rough boundaries using the Rayleigh Rice theory. Physica Scripta. Bristol: IOP Publishing Ltd., 2019, vol. 94, No 4, p. 1-22. ISSN 0031-8949. Available from: https://dx.doi.org/10.1088/1402-4896/aafbc1.

OHLÍDAL, Ivan, Jiří VOHÁNKA, Vilma BURŠÍKOVÁ, Jaroslav ŽENÍŠEK, Petr VAŠINA, Martin ČERMÁK and Daniel FRANTA. Optical characterization of inhomogeneous thin films containing transition layers using the combined method of spectroscopic ellipsometry and spectroscopic reflectometry based on multiple-beam interference model. Journal of Vacuum Science and Technology B:Nanotechnology and Microelectronics. 2019, vol. 37, No 6, p. "062921-1"-"062921-10", 10 pp. ISSN 2166-2746. Available from: https://dx.doi.org/10.1116/1.5122014.

VOHÁNKA, Jiří, Ivan OHLÍDAL, Miloslav OHLÍDAL, Štěpán ŠUSTEK, Martin ČERMÁK, Václav ŠULC, Petr VAŠINA, Jaroslav ŽENÍŠEK and Daniel FRANTA. Optical Characterization of Non-Stoichiometric Silicon Nitride Films Exhibiting Combined Defects. Coatings. Basel: MDPI, 2019, vol. 9, No 7, p. 1-21. ISSN 2079-6412. Available from: https://dx.doi.org/10.3390/coatings9070416.

FRANTA, Daniel, Jiří VOHÁNKA, Martin BRÁNECKÝ, Pavel FRANTA, Martin ČERMÁK, Ivan OHLÍDAL and Vladimír ČECH. Optical properties of the crystalline silicon wafers described using the universal dispersion model. Journal of Vacuum Science & Technology B. New York: A V S AMER INST PHYSICS, 2019, vol. 37, No 6, p. "062907-1"-"062907-14", 14 pp. ISSN 2166-2746. Available from: https://dx.doi.org/10.1116/1.5122284.

FRANTA, Daniel, Jiří VOHÁNKA, Martin ČERMÁK, Pavel FRANTA and Ivan OHLÍDAL. Temperature dependent dispersion models applicable in solid state physics. Journal of Electrical Engineering. Slovenská technická univezita v Bratislavě, 2019, vol. 70, No 7, p. 1-15. ISSN 1335-3632. Available from: https://dx.doi.org/10.2478/jee-2019-0036.

FRANTA, Daniel, Pavel FRANTA, Jiří VOHÁNKA, Martin ČERMÁK and Ivan OHLÍDAL. Determination of thicknesses and temperatures of crystalline silicon wafers from optical measurements in the far infrared region. Journal of Applied Physics. 2018, vol. 123, No 18, p. 185707-185717. ISSN 0021-8979. Available from: https://dx.doi.org/10.1063/1.5026195.

OHLÍDAL, Ivan, Jiří VOHÁNKA, Jan MISTRÍK, Martin ČERMÁK and Daniel FRANTA. Different theoretical approaches at optical characterization of randomly rough silicon surfaces covered with native oxide layers. Surface and Interface Analysis. Wiley, 2018, vol. 50, No 11, p. 1230-1233. ISSN 0142-2421. Available from: https://dx.doi.org/10.1002/sia.6463.

OHLÍDAL, Ivan, Jiří VOHÁNKA, Martin ČERMÁK and Daniel FRANTA. Ellipsometry of Layered Systems. In Olaf Stenzel, Miloslav Ohlídal. Optical Characterization of Thin Solid Films. Cham: Springer, 2018, p. 233-267. Springer Series in Surface Sciences, volume 64. ISBN 978-3-319-75324-9. Available from: https://dx.doi.org/10.1007/978-3-319-75325-6_9.

OHLÍDAL, Ivan, Martin ČERMÁK and Jiří VOHÁNKA. Optical Characterization of Thin Films Exhibiting Defects. In Olaf Stenzel, Miloslav Ohlídal. Optical Characterization of Thin Solid Films. Cham: Springer, 2018, p. 271-313. Springer Series in Surface Sciences, volume 64. ISBN 978-3-319-75324-9. Available from: https://dx.doi.org/10.1007/978-3-319-75325-6_10.

ČERMÁK, Martin, Jiří VOHÁNKA, Ivan OHLÍDAL and Daniel FRANTA. Optical quantities of multi-layer systems with randomly rough boundaries calculated using the exact approach of the Rayleigh–Rice theory. Journal of modern optics. Taylor & Francis, 2018, vol. 65, No 14, p. 1720-1736. ISSN 0950-0340. Available from: https://dx.doi.org/10.1080/09500340.2018.1457187.

FRANTA, Daniel, Jiří VOHÁNKA and Martin ČERMÁK. Universal Dispersion Model for Characterization of Thin Films Over Wide Spectral Range. In Olaf Stenzel, Miloslav Ohlídal. Optical Characterization of Thin Solid Films. Cham: Springer, 2018, p. 31-82. Springer Series in Surface Sciences, volume 64. ISBN 978-3-319-75324-9. Available from: https://dx.doi.org/10.1007/978-3-319-75325-6_3.

VOHÁNKA, Jiří, Ivan OHLÍDAL, Jaroslav ŽENÍŠEK, Petr VAŠINA, Martin ČERMÁK and Daniel FRANTA. Use of the Richardson extrapolation in optics of inhomogeneous layers: Application to optical characterization. Surface and Interface Analysis. Wiley, 2018, vol. 50, No 7, p. 757-765. ISSN 0142-2421. Available from: https://dx.doi.org/10.1002/sia.6473.

FRANTA, Daniel, Martin ČERMÁK, Jiří VOHÁNKA and Ivan OHLÍDAL. Dispersion models describing interband electronic transitions combining Tauc's law and Lorentz model. Thin Solid Films. LAUSANNE, SWITZERLAND: ELSEVIER SCIENCE SA, 2017, vol. 631, June, p. 12-22. ISSN 0040-6090. Available from: https://dx.doi.org/10.1016/j.tsf.2017.03.051.

OHLÍDAL, Ivan, Jiří VOHÁNKA, Martin ČERMÁK and Daniel FRANTA. Optical characterization of randomly microrough surfaces covered with very thin overlayers using effective medium approximation and Rayleigh-Rice theory. Applied Surface Science. AMSTERDAM: Elsevier Science, 2017, vol. 419, October, p. 942-956. ISSN 0169-4332. Available from: https://dx.doi.org/10.1016/j.apsusc.2017.04.211.

ČERMÁK, Martin and Martin ZOUHAR. Cosmologically inspired Kastor-Traschen solution. In 10th Vienna Central European Seminar on Particle Physics and Quantum Field Theory. 2014.

ČERMÁK, Martin and Martin ZOUHAR. Cosmologically inspired Kastor-Traschen solution. Physical review D. 2014, vol. 89, No 8, p. "neuvedeno", 15 pp. ISSN 1550-7998. Available from: https://dx.doi.org/10.1103/PhysRevD.89.084024.

ČERMÁK, Martin and Martin ZOUHAR. Thin Static Charged Dust Majumdar–Papapetrou Shells with High Symmetry in D>=4. International Journal of Theoretical Physics. Springer, 2012, vol. 51, No 8, p. 2455-2469. ISSN 0020-7748. Available from: https://dx.doi.org/10.1007/s10773-012-1126-6.

ČERMÁK, Martin, L. HAVLÍČEK and Martin ZOUHAR. Tensile stress and penetration test of the Red Haven peaches skin. Acta Universitatis Agriculturae et Silviculturae Mendelianae Brunensis. Brno: Mendelova zem. a les. univerzita, 2011, vol. 59, No 1, p. 23-28. ISSN 1211-8516.

ČERMÁK, Martin, Pavel SŤAHEL, Vilma BURŠÍKOVÁ, Zdeněk NAVRÁTIL and David TRUNEC. Depozice hydrofobních polymerových vrstev v povrchovém barierovém výboji za atmosfericlého tlaku (Deposition of hydrophobic polymer films in surface barrier discharge at atmospheric pressure). In Sborník Juniormat'03 4th International Conference. 1st. Brno: Faculty of Mechanical Engineering, BUT, 2003, p. 264-265. ISBN 80-214-2462-1.