Výpis publikací

FRIÁK, Martin, Quynh Nhu Thi TRAN, Mojmír MEDUŇA, Kristýna GAZDOVÁ, Jana PAVLŮ, Dominik MUNZAR a Hoa Hong NGUYEN. Vacancy-induced magnetic states in TiO2 surfaces. Journal of Applied Physics. AIP Publishing, roč. 134, č. 1, s. "013902-1"-"013902-11", 11 s. ISSN 0021-8979. doi:10.1063/5.0155282. 2023.

MEDUŇA, Mojmír, Fabio ISA, Franco BRESSAN a von Känel HANS. The Radon transform as a tool for 3D reciprocal-space mapping of epitaxial microcrystals. Journal of Applied Crystallography. International Union of Crystallography, roč. 55, August, s. 823-836. ISSN 1600-5767. doi:10.1107/S1600576722004885. 2022.

MEDUŇA, Mojmír, Ondřej CAHA, Emanuil CHOUMAS, Franco BRESSAN a Hans VON KÄNEL. X-ray rocking curve imaging on large arrays of extremely tall SiGe microcrystals epitaxial on Si. Journal of Applied Crystallography. International Union of Crystallography, roč. 54, August, s. 1071-1080. ISSN 0021-8898. doi:10.1107/S1600576721004969. 2021.

FALUB, Claudiu V., Srinivas V. PIETAMBARAM, Oguz YILDIRIM, Mojmír MEDUŇA, Ondřej CAHA, Rachid HIDA, Xue ZHAO, Jan AMBROSINI, Hartmut ROHRMANN a Hans J. HUG. Enhanced permeability dielectric thin films with tailored properties deposited by magnetron sputtering on silicon. AIP Advances. New York: AMER INST PHYSICS, roč. 9, č. 3, s. 035243-35248. ISSN 2158-3226. doi:10.1063/1.5079477. 2019.

MEDUŇA, Mojmír, Thomas KREILIGER, Marco MAUCERI, Marco PUGLISI, Fulvio MANCARELLA, Francesco LA VIA, Danilo CRIPPA, Leo MIGLIO a Hans VON KÄNEL. X-ray diffraction on stacking faults in 3C-SiC epitaxial microcrystals grown on patterned Si(0 0 1) wafers. Journal of Crystal Growth. Amsterdam: Elsevier, roč. 507, 1 February 2019, s. 70-76. ISSN 0022-0248. doi:10.1016/j.jcrysgro.2018.10.046. 2019.

MEDUŇA, Mojmír, Claudiu Valentin FALUB, Fabio ISA a Hans VON KÄNEL. Growth temperature dependent strain in relaxed Ge microcrystals. Thin Solid Films. Elsevier, roč. 664, OCT, s. 115-123. ISSN 0040-6090. doi:10.1016/j.tsf.2018.08.033. 2018.

FALUB, Claudiu Valentin, Martin BLESS, Rachid HIDA, Mojmír MEDUŇA a Arnold AMMANN. Innovative soft magnetic multilayers with enhanced in-plane anisotropy and ferromagnetic resonance frequency for integrated RF passive devices. AIP Advances. MELVILLE, roč. 8, č. 4, s. 048002-48015. ISSN 2158-3226. doi:10.1063/1.4993688. 2018.

MEDUŇA, Mojmír, Fabio ISA, Arik JUNG, Anna MARZEGALLI, Marco ALBANI, Giovanni ISELLA, Kai ZWEIACKER, Leo MIGLIO a Hans VON KÄNEL. Lattice tilt and strain mapped by X-ray scanning nanodiffraction in compositionally graded SiGe/Si microcrystals. Journal of Applied Crystallography. Chester: INT UNION CRYSTALLOGRAPHY, roč. 51, č. 2, s. 368-385. ISSN 1600-5767. doi:10.1107/S1600576718001450. 2018.

FULUB, C., R. HIDA, Mojmír MEDUŇA, M BLESS, J. RICHTER, H. ROHRMANN, T. NADIG a M. PADRUN. Nanostructured Soft Magnetic Multilayers with Tunable Properties for On-Chip Micro-Magnetic Devices. In 2018 IEEE INTERNATIONAL MAGNETIC CONFERENCE (INTERMAG). NEW YORK: IEEE International Magnetics Conference (INTERMAG). s. "1800BB03", 1 s. ISBN 978-1-5386-6425-4. doi:10.1109/INTMAG.2018.8508178. 2018.

ISA, Fabio, Arik JUNG, Marco SALVALAGLIO, Yadira Arroyo Rojas DASILVA, Ivan MAROZAU, Mojmír MEDUŇA, Michael BARGET, Anna MARZEGALLI, Giovanni ISELLA, Rolf ERNI, Fabio PEZZOLI, Emiliano BONERA, Philippe NIEDERMANN, Olha SEREDA, Pierangelo GRONING, Francesco MONTALENTI a Hans VON KAENEL. Strain Engineering in Highly Mismatched SiGe/Si Heterostructures. Materials Science in Semiconductor Processing. Oxford: Elsevier Science, roč. 70, November, s. 117-122. ISSN 1369-8001. doi:10.1016/j.mssp.2016.08.019. 2017.

FALUB, Claudiu Valentin, Rachid HIDA, Mojmír MEDUŇA, Josef ZWECK, Jean-Philippe MICHEL, Henri SIBUET, Daniel SCHNEIDER, Martin BLESS, Jan H. RICHTER a Hartmut ROHRMANN. Structural and Ferromagnetic Properties of Sputtered FeCoB/AlN Soft Magnetic Multilayers for GHz Applications. IEEE TRANSACTIONS ON MAGNETICS. PISCATAWAY: IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC, roč. 53, č. 11, s. 2002906-2002911. ISSN 0018-9464. doi:10.1109/TMAG.2017.2703175. 2017.

FALUB, Claudiu V., Hartmut ROHRMANN, Martin BLESS, Mojmír MEDUŇA, Miguel MARIONI, Daniel SCHNEIDER, Jan H. RICHTER a Marco PADRUN. Tailoring the soft magnetic properties of sputtered multilayers by microstructure engineering for high frequency applications. AIP Advances. MELVILLE: AMER INST PHYSICS, roč. 7, č. 5, s. nestránkováno, 7 s. ISSN 2158-3226. doi:10.1063/1.4973945. 2017.

ISA, Fabio, Arik JUNG, Marco SALVALAGLIO, Yadira Arroyo Rojas DASILVA, Mojmír MEDUŇA, Michael BARGET, Thomas KREILIGER, Giovanni ISELLA, Rolf ERNI, Fabio PEZZOLI, Emiliano BONERA, Philippe NIEDERMANN, Kai ZWEIACKER, Antonia NEELS, Alex DOMMANN, Pierangelo GRONING, Francesco MONTALENTI a Hans VON KANEL. Elastic and Plastic Stress Relaxation in Highly Mismatched SiGe/Si Crystals. MRS ADVANCES. New York: CAMBRIDGE UNIV PRESS, roč. 1, č. 50, s. 3403-3408. ISSN 2059-8521. doi:10.1557/adv.2016.355. 2016.

TABOADA, AG, Mojmír MEDUŇA, M. SALVALAGLIO, F. ISA, T. KREILIGER, CV FALUB, EB MEIER, E. MULLER, L. MIGLIO, G. ISELLA a Hans VON KAENEL. GaAs/Ge crystals grown on Si substrates patterned down to the micron scale. Journal of Applied Physics. Melville: AMER INST PHYSICS, roč. 119, č. 5, s. nestránkováno, 12 s. ISSN 0021-8979. doi:10.1063/1.4940379. 2016.

ISA, F., M. SALVALAGLIO, YAR. DASILVA, Mojmír MEDUŇA, M. BARGET, A. JUNG, T. KREILIGER, Gisella CANO I RUIZ, R. ERNI, F. PEZZOLI, E. BONERA, P. NIEDERMANN, P. GRONING, F. MONTALENTI a Hans VON KAENEL. Highly Mismatched, Dislocation-Free SiGe/Si Heterostructures. ADVANCED MATERIALS. WEINHEIM: WILEY-V C H VERLAG GMBH, roč. 28, č. 5, s. 884-888. ISSN 0935-9648. doi:10.1002/adma.201504029. 2016.

MEDUŇA, Mojmír, Claudiu Valentin FALUB, Fabio ISA, Anna MARZEGALLI, Daniel CHRASTINA, Giovanni ISELLA, Leo MIGLIO, Alex DOMMANN a Hans VON KAENEL. Lattice bending in three-dimensional Ge microcrystals studied by X-ray nanodiffraction and modelling. Journal of Applied Crystallography. Chester: INT UNION CRYSTALLOGRAPHY, roč. 49, June, s. 976-986. ISSN 1600-5767. doi:10.1107/S1600576716006397. 2016.

MEDUŇA, Mojmír, Thomas KREILIGER, Ivan PRIETO, Marco MAUCERI, Marco PUGLISI, Fulvio MANCARELLA, Francesco LA VIA, Danilo CRIPPA, Leo MIGLIO a Hans VON KÄNEL. Stacking Fault Analysis of Epitaxial 3C-SiC on Si(001) Ridges. Materials Science Forum. Switzerland: Trans Tech Publications, roč. 858, May, s. 147-150. ISSN 1662-9752. doi:10.4028/www.scientific.net/MSF.858.147. 2016.

ROZBOŘIL, Jakub, Mojmír MEDUŇA, Claudiu Valentin FALUB, Fabio ISA a Hans VON KÄNEL. Strain relaxation in Ge microcrystals studied by high-resolution X-ray diffraction. PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE. WEINHEIM: Wiley, roč. 213, č. 2, s. 463-469. ISSN 1862-6300. doi:10.1002/pssa.201532643. 2016.

ISA, Fabio, Fabio PEZZOLI, G. ISELLA, Mojmír MEDUŇA, C.V. FALUB, E. MÜLLER, Thomas KREILIGER, A. G. TABOADA, Hans VON KAENEL a Leo MIGLIO. Three-dimensional Ge/SiGe multiple quantum wells deposited on Si(001) and Si(111) patterned substrates. Semiconductor Science and Technology. Bristol (Velká Britanie): IOP Publishing Ltd, roč. 30, č. 10, s. nestránkováno, 9 s. ISSN 0268-1242. doi:10.1088/0268-1242/30/10/105001. 2015.

KREILIGER, Thomas, Claudiu Valentin FALUB, Fabio ISA, G. ISELLA, D. CHRASTINA, R. BERGAMASCHINI, A. MARZEGALLI, R. KAUFMANN, P. NIEDERMANN, A. NEELS, E. MÜLLER, Mojmír MEDUŇA, Alex DOMMANN, Leo MIGLIO a Hans VON KANEL. Epitaxial Ge-crystal arrays for X-ray detection. Journal of Instrumentation. BRISTOL: IOP PUBLISHING, roč. 9, March 2014, s. "C03019", 10 s. ISSN 1748-0221. doi:10.1088/1748-0221/9/03/C03019. 2014.

MEDUŇA, Mojmír, Claudiu Valentin FALUB, Isa FABIO, Daniel CHRASTINA, Thomas KREILIGER, Giovanni ISELLA a Hans VON KÄNEL. Reconstruction of crystal shapes by X-ray nanodiffraction from three-dimensional superlattices. Journal of Applied Crystallography. Hoboken (USA): John Wiley & Sons Ltd, roč. 47, č. 6, s. 2030-2037. ISSN 0021-8898. doi:10.1107/S1600576714023772. 2014.

VON KÄNEL, Hans, Fabio ISA, Claudiu Valentin FALUB, E. J. BARTHAZY, Elisabeth MÜLLER, Daniel CHRASTINA, Giovanni ISELLA, Thomas KREILIGER, Alfonso TABOADA, Mojmír MEDUŇA, R. KAUFMANN, A. NEELS, Alex DOMMANN, Philippe NIEDERMANN, F. MANCARELLA, M. MAUCERI, M. PUGLISI, D. CRIPPA, F. LA VIA, R. ANZALONE, N. PILUSO, Roberto BERGAMASCHINI, Anna MARZEGALLI a Leo MIGLIO. Three-dimensional Epitaxial Si1-xGex, Ge and SiC Crystals on Deeply Patterned Si Substrates. In SIGE, GE, AND RELATED COMPOUNDS 6: MATERIALS, PROCESSING, AND DEVICES. Pennington: Electrochemical Society Inc. s. 631-648. ISBN 978-1-60768-543-2. doi:10.1149/06406.0631ecst. 2014.

MEDUŇA, Mojmír, Claudiu Valentin FALUB, Fabio ISA, Daniel CHRASTINA, Thomas KREILIGER, Giovanni ISELLA, Alfonso TABOADA, Philippe NIEDERMANN a Hans VON KÄNEL. X-Ray Nano-Diffraction on Epitaxial Crystals. Quantum Matter. American Scientific Publishers, roč. 3, č. 4, s. 290-296. ISSN 2164-7615. doi:10.1166/qm.2014.1127. 2014.

FALUB, Claudiu Valentin, Thomas KREILIGER, Fabio ISA, Alfonso TABOADA, Mojmír MEDUŇA, Fabio PEZZOLI, Roberto BERGAMASCHINI, Anna MARZEGALLI, Elisabeth MÜLLER, Daniel CHRASTINA, Giovanni ISELLA, Antonia NEELS, Philippe NIEDERMANN, Alex DOMMANN, Leo MIGLIO a Hans VON KÄNEL. 3D Heteroepitaxy of Mismatched Semiconductors on Silicon. Thin Solid Films. Lausanne (Switzerland): Elsevier, roč. 557, 30 April 2014, s. 42-49. ISSN 0040-6090. doi:10.1016/j.tsf.2013.10.094. 2014.

FALUB, Claudiu Valentin, Mojmír MEDUŇA, Daniel CHRASTINA, Fabio ISA, Anna MARZEGALLI, Thomas KREILIGER, Alfonso TABOADA, Giovanni ISELLA, Leo MIGLIO, Alex DOMMANN a Hans VON KAENEL. Perfect crystals grown from imperfect interfaces. Scientific Reports. London: Nature Publishing Group, roč. 3, Jul, s. "nestránkováno", 6 s. ISSN 2045-2322. doi:10.1038/srep02276. 2013.

MEDUŇA, Mojmír, Jiří RŮŽIČKA, Ondřej CAHA, Jiří BURŠÍK a Milan SVOBODA. Precipitation in silicon wafers after high temperature preanneal studied by X-ray diffraction methods. Physica B condensed matter. Amsterdam: Elsevier Science, roč. 407, č. 15, s. 3002-3005. ISSN 0921-4526. doi:10.1016/j.physb.2011.08.063. 2012.

FALUB, C.V., F. ISA, T. KREILIGER, R. BERGAMASCHINI, A. MARZEGALLI, A.G. TABOADA, D. CHRASTINA, G. ISELLA, E. MÜLLER, P. NIEDERMANN, A. DOMMANN, A. NEELS, A. PEZOUS, Mojmír MEDUŇA, L. MIGLIO a Hans VON KÄNEL. Space-filling arrays of three-dimensional epitaxial Ge and Si1-xGex crystals. In Tsu Jae King Liu. 2012 International Silicon-Germanium Technology and Device Meeting, ISTDM 2012 - Proceedings. Berkeley, CA: EEE eXpress Conference Publishing. s. 60-61. ISBN 978-1-4577-1862-5. doi:10.1109/ISTDM.2012.6222457. 2012.

MEDUŇA, Mojmír, Ondřej CAHA a Jiří BURŠÍK. Studies of influence of high temperature preannealing on oxygen precipitation in CZ Si wafers. Journal of crystal growth. Amsterdam: Elsevier Science, roč. 348, č. 1, s. 53-59. ISSN 0022-0248. doi:10.1016/j.jcrysgro.2012.03.048. 2012.

FALUB, Claudiu Valentin, Thomas KREILIGER, A. TABOADA, Fabio ISA, Daniel CHRASTINA, G. ISELLA, E. MULLER, Mojmír MEDUŇA, R. BERGAMASCHINI, Anna MARZEGALLI, E. BONERA, F. PEZZOLI, Leo MIGLIO, P. NIEDERMANN, A. NEELS, A. PEZOUS, R. KAUFMANN, A. DOMMANN a Hans VON KAENEL. Three Dimensional Heteroepitaxy: A New Path For Monolithically Integrating Mismatched Materials With Silicon. In 2012 International Semiconductor Conference (CAS) Vols 1 and 2. New York: IEEE. s. 45-50. ISBN 978-1-4673-0736-9. doi:10.1109/SMICND.2012.6400698. 2012.

KUBĚNA, Josef, Alan KUBĚNA, Ondřej CAHA a Mojmír MEDUŇA. Homogeneous and heterogeneous nucleation of oxygen in Si-CZ. Solid State Phenomena. Switzerland: Trans Tech Publications, Neuveden, 178-179, s. 495-500. ISSN 1012-0394. 2011.

MEDUŇA, Mojmír, Ondřej CAHA, Jiří RŮŽIČKA, Silvie BERNATOVÁ, Milan SVOBODA a Jiří BURŠÍK. Oxygen precipitation studied by x-ray diffraction techniques. Solid State Phenomena. Trans Tech Publications, Neuveden, 178-179, s. 325-330. ISSN 1012-0394. 2011.

DIETSCH, R., A. RACK, T. WEITKAMP, M. RIOTTE, T. RACK, T. HOLZ, M. KRÄMER, D. WEISSBACH, C. MORAWE, F. SIEWERT, Mojmír MEDUŇA, P. CLOETENS a E. ZIEGLER. Performance of multilayer monochromators for hard X-ray imaging with coherent synchrotron radiation. In Ian McNulty, Catherine Eyberger, Barry Lai. THE 10TH INTERNATIONAL CONFERENCE ON X‐RAY MICROSCOPY. USA: AIP. s. 77-80. ISBN 978-0-7354-0925-5. doi:10.1063/1.3625308. 2011.

CAHA, Ondřej, Silvie BERNATOVÁ, Mojmír MEDUŇA, Milan SVOBODA a Jiří BURŠÍK. Study of oxide precipitates in silicon using X-ray diffraction techniques. physica status solidi (a), Applied research. Wiley-Blackwell, roč. 208, č. 11, s. 2587-2590. ISSN 1862-6300. doi:10.1002/pssa.201184263. 2011.

RŮŽIČKA, Jiří a Mojmír MEDUŇA. X-RAY LAUE DIFFRACTION STUDY OF OXYGEN PRECIPITATES IN CZOCHRALSKI SILICON. Materials Structure in Chemistry, Biology, Physics and Technology. Czech Republic: Czech and Slovak Crystallographic Associ, roč. 18, č. 3, s. 204-208. ISSN 1211-5894. 2011.

RACK, A., T. WEITKAMP, M. RIOTTE, D. GRIGORIEV, T. RACK, L. HELFEN, T. BAUMBACH, R. DIETSCH, T. HOLZ, M. KRÄMER, F. SIEWERT, Mojmír MEDUŇA, P. CLOETENS a E. ZIEGLER. Comparative study of multilayers used in monochromators for synchrotron-based coherent hard X-ray imaging. Journal of Synchrotron Radiation. USA: WILEY-BLACKWELL PUBLISHING, roč. 17, č. 4, s. 496-510. ISSN 0909-0495. 2010.

SVOBODA, Milan, Jiří BURŠÍK, Mojmír MEDUŇA, Ondřej CAHA a Josef KUBĚNA. Defect Engineering in Czochralski-grown Silicon Studied by TEM. ISBN 978-85-63273-06-2. 2010.

RACK, A., T. WEITKAMP, M. RIOTTE, T. RACK, R. DIETSCH, T. HOLZ, M. KRÄMER, F. SIEWERT, Mojmír MEDUŇA, Ch. MORAWE, P. CLOETENS a E. ZIEGLER. Micro-imaging performance of multilayers used as monochromators for coherent hard X-ray synchrotron radiation. Proceedings of SPIE - The International Society for Optical Engineering. Neuveden, č. 7802, s. "nestánkováno", 7 s. ISSN 0277-786X. doi:10.1117/12.858355. 2010.

MEDUŇA, Mojmír, Ondřej CAHA, Josef KUBĚNA, Alan KUBĚNA, Milan SVOBODA a Jiří BURŠÍK. Oxygen Precipitation in CZ Si Wafers after High Temperature Pre-annealing. In SILICON 2010. ISBN 978-80-254-7361-0. 2010.

CAHA, Ondřej, Mojmír MEDUŇA, Silvie BERNATOVÁ, Jiří RŮŽIČKA, Petr MIKULÍK, Jiří BURŠÍK, Milan SVOBODA a S. BERNSTORFF. X-ray scattering study of oxide precipitates in Cz-Si. ISBN 978-80-254-7361-0. 2010.

KUBĚNA, Josef, Alan KUBĚNA, Ondřej CAHA a Mojmír MEDUŇA. Analysis of vacancy and interstitial nucleation kinetics in Si wafers during rapid thermal annealing. J.Phys.: Condens. Matter. Velká Britanie: IOP Publishing Ltd, roč. 21, č. 10, s. 105402-105412. ISSN 0953-8984. 2009.

MEDUŇA, Mojmír, Ondřej CAHA, Josef KUBĚNA, Alan KUBĚNA a Jiří BURŠÍK. Homogenization of CZ Si wafers by Tabula Rasa annealing. Physica B condensed matter. Amsterdam: Elsevier Science, roč. 404, 23-24, s. 4637–4640. ISSN 0921-4526. 2009.

MEDUŇA, Mojmír, Ondřej CAHA, Josef KUBĚNA, Alan KUBĚNA a Jiří BURŠÍK. Homogenization of CZ Si wafers by Tabula Rasa annealing. In ICDS-25, 25th International Conference on Defects in Semiconductors, July 20-24, 2009 in St. Petersburg. ISBN 978-5-93634-048-2. 2009.

MEDUŇA, Mojmír, Ondřej CAHA, Mario KEPLINGER, Julian STANGL, Günther BAUER, Gregor MUSSLER a Detlev GRÜTZMACHER. Interdiffusion in Ge rich SiGe/Ge multilayers studied by in situ diffraction. Physica stat.sol.(a). roč. 206, č. 8, s. 1775-1779. ISSN 1862-6300. 2009.

NEČAS, David, Lenka ZAJÍČKOVÁ, Daniel FRANTA, Pavel SŤAHEL, Petr MIKULÍK, Mojmír MEDUŇA a Miroslav VALTR. Optical Characterization of Ultra-Thin Iron and Iron Oxide Films. e-Journal of Surface Science and Nanotechnology. Tokyo: The Surface Science Society of Japan, roč. 7, březen, s. 486-490. ISSN 1348-0391. 2009.

JÍŠA, Jan a Mojmír MEDUŇA. Towards limits of x-ray specular reflectivity. Materials Structure in Chemistry, Biology, Physics and Technology. Czech Republic: Czech and Slovak Crystallographic Associ, roč. 16, 2a, s. k60, 2 s. ISSN 1211-5894. 2009.

CAHA, Ondřej, Josef KUBĚNA, Alan KUBĚNA a Mojmír MEDUŇA. Vacancies and self-interstitials dynamics in silicon wafers. Solid State Phenomena. Switzerland: Trans Tech Publications, Neuveden, 156-158, s. 139-144. ISSN 1012-0394. 2009.

CAHA, Ondřej a Mojmír MEDUŇA. X-ray diffraction on precipitates in Czochralski-grown silicon. Physica B condensed matter. Amsterdam: Elsevier Science, roč. 404, 23-24, s. 4626-4629. ISSN 0921-4526. 2009.

CAHA, Ondřej a Mojmír MEDUŇA. X-ray diffraction on precipitates in Czochralski-grown silicon. In ICDS-25, 25th International Conference on Defects in Semiconductors, July 20-24, 2009 in St. Petersburg. ISBN 978-5-93634-048-2. 2009.

MEDUŇA, Mojmír, Jiří NOVÁK, Günther BAUER, Claudiu FALUB a Detlev GRÜTZMACHER. Interdiffusion in SiGe alloys with Ge contents of 25% and 50% studied by x-ray reflectivity. Physica stat.sol.(a). roč. 205, č. 10, s. 2441-2448. ISSN 1862-6300. 2008.

COLOMBI, Paolo, Dileepa AGNIHOTRI, V. E. ASADCHIKOV, Elza BONTEMPI, D. Keith BOWEN, Chang-Hwan CHANG, Laura E. DEPERO, Mark FARNWORTH, Toshiyuki FUJIMOTO, Alan GIBAUD, Matej JERGEL, Michael KRUMREY, Alessio LAMPERTI, Tamzin LAFFORD, Richard J MATYI, T. MA, Mojmír MEDUŇA, Silvia MILITA, Kenji SAKURAI, Leonid SHABEL'NIKOV, Alexander ULYANENKOV, A. van der LEE a Claudia WIEMER. Reproducibility in X-ray reflectometry: results from the first world-wide round-robin experiment. J. Appl. Crystallography. Velká Britanie: Int. Union of Crystallography, roč. 41, č. 1, s. 143-152. ISSN 0021-8898. 2008.

MATYI, Richard J, Laura E. DEPERO, Elza BONTEMPI, Paolo COLOMBI, Alan GIBAUD, Matej JERGEL, Michael KRUMREY, Tamzin LAFFORD, Alessio LAMPERTI, Mojmír MEDUŇA, A. van der LEE a Claudia WIEMER. The international VAMAS project on X-ray reflectivity measurements for evaluation of thin films and multilayers - Preliminary results from the second round-robin. Thin Solid Films. Elsevier, roč. 516, č. 22, s. 7962-7966. ISSN 0040-6090. 2008.

MEDUŇA, Mojmír, Jiří NOVÁK, Günther BAUER, Václav HOLÝ, Claudiu FALUB, Soichiro TSUJINO a Detlev GRÜTZMACHER. In situ investigations of Si and Ge interdiffusion in Ge-rich Si/SiGe multilayers using x-ray scattering. Semicond. Sci. Technol. Velká Britanie: IOP Publishing Ltd, roč. 22, č. 4, s. 447–453. ISSN 0268-1242. 2007.

MEDUŇA, Mojmír, Jiří NOVÁK, Günther BAUER, Václav HOLÝ, Claudiu FALUB, Soichiro TSUJINO a Detlev GRÜTZMACHER. Interdiffusion in SiGe alloys studied by x-rays. Materials Structure in Chemistry, Biology, Physics and Technology. Praha, roč. 14, č. 2, s. 122-123. ISSN 1211-5894. 2007.

MEDUŇA, Mojmír, Jiří NOVÁK, Václav HOLÝ, Günther BAUER, Claudiu FALUB, Soichiro TSUJINO a Detlev GRÜTZMACHER. In-situ investigations of Si and Ge interdiffusion in Si cascade structures. Synchrotron Radiation in Natural Sciences. Warsaw: Polish Synchrotron Radiation Society, roč. 5, 1-2, s. 76. ISSN 1644-7190. 2006.

MEDUŇA, Mojmír, Jiří NOVÁK, Václav HOLÝ, Claudiu FALUB, Günther BAUER a Detlev GRÜTZMACHER. IN-SITU INVESTIGATIONS OF SI AND GE INTERDIFFUSION IN SI CASCADE STRUCTURES. Materials Structure in Chemistry, Biology, Physics and Technology. Praha, roč. 13, č. 3, s. 161. ISSN 1211-5894. 2006.

MEDUŇA, Mojmír, Jiří NOVÁK, Václav HOLÝ, Günther BAUER, Claudiu FALUB, Soichiro TSUJINO a Detlev GRÜTZMACHER. IN-SITU INVESTIGATIONS OF SI AND GE INTERDIFFUSION IN SIGE MULTILAYERS AND CASCADE STRUCTURES. In XTOP 2006 - 8th Biennial Conference on High Resolution X-Ray Diffraction and Imaging. Karlsruhe: Forchungszentrum Karlsruhe. s. 124. 2006.

AGNIHOTRI, Dileepa, V. E. ASADCHIKOV, Elza BONTEMPI, Chang-Hwan CHANG, Paolo COLOMBI, Laura E. DEPERO, Mark FARNWORTH, Toshiyuki FUJIMOTO, Alan GIBAUD, Matej JERGEL, D. Keith BOWEN, Michael KRUMREY, Alessio LAMPERTI, Tamzin A. LAFFORD, Richard J MATYI, T. MA, Mojmír MEDUŇA, Silvia MILITA, Kenji SAKURAI, Leonid SHABEL'NIKOV, S. SONI, Alexander ULYANENKOV, A. van der LEE a Claudia WIEMER. X-Ray Reflectivity measurements to evaluate thin films and multilayers thickness: preliminary results of the first world Round-Robin Test. In XTOP 2006 - 8th Biennial Conference on High Resolution X-Ray Diffraction and Imaging. Karlsruhe: Forchungszentrum Karlsruhe. s. 75. 2006.

MEDUŇA, Mojmír, Jiří NOVÁK, Claudiu FALUB, Günther BAUER a Detlev GRÜTZMACHER. High Temperature in-situ Investigation of Si/SiGe Multilayers and Cascade Structures. Materials Structure in Chemistry, Biology, Physics and Technology. Praha, roč. 12, č. 2, s. 126. ISSN 1211-5894. 2005.

MEDUŇA, Mojmír, Jiří NOVÁK, Günther BAUER, Claudiu FALUB a Detlev GRÜTZMACHER. HIGH TEMPERATURE INVESTIGATION OF SiGe/Si-BASED CASCADE EMITTERS IN THE FAR-INFRARED. In XXXIV International School on the Physics of Semiconducting Compounds, Jaszowiec 2005. 2005.

MEDUŇA, Mojmír, Jiří NOVÁK, Claudiu FALUB, Gang CHEN, Günther BAUER, Soichiro TSUJINO, Detlev GRÜTZMACHER, Elisabeth MÜLLER, Yves CAMPIDELLI, Olivier KERMARREC, Daniel BENSAHEL a Norbert SCHELL. High temperature investigations of Si/SiGe based cascade structures using x-ray scattering methods. J. Phys. D: Appl. Phys. Bristol, UK: IOP Publishing, Ltd., roč. 38, 10A, s. A121-A125, 5 s. ISSN 0022-3727. 2005.

FROMHERZ, Thomas, Mojmír MEDUŇA, Günther BAUER, Alex BORAK, Claudiu FALUB, Soichiro TSUJINO, Hans SIGG a Detlev GRÜTZMACHER. Intersubband absorption of strain compensated, Si1-xGex valenceband quantum wells with 0.7<=x<=0.85. J. Appl. Phys. USA: American Institute of Physics, roč. 98, č. 4, s. 044501-1 - 044501-7, 7 s. ISSN 0021-8979. 2005.

FALUB, Claudiu, Mojmír MEDUŇA, Elisabeth MÜLLER, Soichiro TSUJINO, Alex BORAK, Hans SIGG, Detlev GRÜTZMACHER, Thomas FROMHERZ a Günther BAUER. Structural studies of strain-symmetrised Si/SiGe structures grown by molecular beam epitaxy. Journal of crystal growth. Amsterdam: Elsevier Science, roč. 278, 1-4, s. 495-499. ISSN 0022-0248. 2005.

MEDUŇA, Mojmír, Jiří NOVÁK, Václav HOLÝ, Günther BAUER, Claudiu FALUB, Soichiro TSUJINO, Elisabeth MÜLLER, Detlev GRÜTZMACHER, Yves CAMPIDELLI, Olivier KERMARREC a Daniel BENSAHEL. Annealing studies of high Ge composition Si/SiGe multilayers. Zeitschrift fur Kristalographie. R. Oldenbourg Verlag GmbH, roč. 219, č. 4, s. 195-200. ISSN 0044-2968. 2004.

CAHA, Ondřej, Vlastimil KŘÁPEK, Václav HOLÝ, S. MOSS, J. LI, A. NORMAN, A. MASCARENHAS, J. RENO, J. STANGL a Mojmír MEDUŇA. X-ray diffraction on laterally modulated (InAs)n/(AlAs)m short-period superlattices. Journal of Applied Physics. USA: American Institute of Physics, roč. 96, č. 9, s. 4833-4838. ISSN 0021-8979. 2004.

HOLÝ, Václav, Mojmír MEDUŇA, Tomáš ROCH a Guenther BAUER. Diffuse x-ray reflectivity from self-assembled ripples with superimposed roughness in Si/Ge superlattices. Semicond. Sci. Technol. Velká Britanie: IOP Publishing Ltd, roč. 17, č. 1, s. 480-486. ISSN 0268-1242. 2002.

HOLÝ, Václav a Mojmír MEDUŇA. Investigation of morphology and chemical composition of self-organized semiconductor quantum dots and wires by X-ray scattering. Acta Physica Polonica. A102, č. 3, s. 7-19. ISSN 0587-4254. 2002.

LI, Jianhua, Václav HOLÝ a Mojmír MEDUŇA. Lateral composition modulation in (InAs)(n)/(AlAs)(m) short-period superlattices investigated by high-resolution x-ray scattering. Physical Review B. USA: The American Physical Society, roč. 66, č. 8, s. 115312-115328. ISSN 0163-1829. 2002.

MEDUŇA, Mojmír, Václav HOLÝ a Julian STANGL. Non-specular X-ray reflection from self-organized ripple structures in Si/Ge multilayers. Physica E. Amsterdam: Elsevier Science, roč. 13, č. 4, s. 1003-1009. ISSN 1386-9477. 2002.

ROCH, Tomáš, Mojmír MEDUŇA, Julian STANGL, Anke HESSE, Rainer T LECHNER, Guenther BAUER, G. DEHLINGER, L. DIEHL, U. GENNSER, Elisabeth MÜLLER a Detlev GRÜTZMACHER. Interface roughness in SiGe quantum-cascade structures from x-ray reflectivity studies. Journal of Applied Physics. USA: American Institute of Physics, roč. 91, č. 11, s. 8974-8978. ISSN 0021-8979. 2001.

MEDUŇA, Mojmír, V. HOLY, T. ROCH a G. BAUER. X-ray reflectivity from self-assembled structures in Ge/Si superlattices. J. Phys.D.: Appl. Phys. Velká Britanie: IOP Publishing Ltd, roč. 34, 10A, s. 193-196. ISSN 0022-3727. 2001.

MEDUŇA, Mojmír, Václav HOLÝ a T. ROCH. X-ray reflectivity of self-assembled structures in SiGe multilayers and comparison with atomic force microscopy. Journal of Applied Physics. USA: American institute of physics, roč. 89, č. 9, s. 4836-4842. ISSN 0021-8979. 2001.

ROCH, T., V. HOLY, Mojmír MEDUŇA a G. BAUER. X-ray studies on self-organized wires in SiGe/Si multilayers. J. Phys.D.: Appl. Phys. Velká Britanie: IOP Publishing Ltd, roč. 34, 10A, s. A6-A10, 5 s. ISSN 0022-3727. 2001.

MEDUŇA, Mojmír, Václav HOLÝ, Josef KUBĚNA, Julian STANGL, Gunter BAUER, Jian-hong ZHU a Karl BRUNNER. RTG reflexe laterálních struktur SiGe. In 13. konference slovenských a českých fyzikov. Zvolen: Slovenská fyzikálna spoločnosť. s. 237-239. ISBN 80-228-0876-8. 2000.