Výpis publikací

2005

1. Atomic force microscopy analysis of morphology of the upper boundaries of GaN thin films prepared by MOCVD

   KLAPETEK, Petr, Ivan OHLÍDAL, Alberto MONTAIGNE RAMIL, Alberta BONNANNI a Helmut SITTER. Atomic force microscopy analysis of morphology of the upper boundaries of GaN thin films prepared by MOCVD. Vacuum. USA: ELSEVIER (PERGAMON), 2005, roč. 80, 1-3, s. 53-57. ISSN 0042-207X.

   Podrobněji: https://is.muni.cz/publication/630333/cs