Masaryk University

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    2003

    1. Theoretical analysis of the atomic force microscopy characterization of columnar thin films
      KLAPETEK, Petr and Ivan OHLÍDAL. Theoretical analysis of the atomic force microscopy characterization of columnar thin films. Ultramicroscopy. Amsterdam: Elsevier, 2003, vol. 94, No 1, p. 19-29. ISSN 0304-3991.
      More: https://is.muni.cz/publication/485221/en
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