Masaryk University

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    2005

    1. Atomic force microscopy analysis of morphology of the upper boundaries of GaN thin films prepared by MOCVD
      KLAPETEK, Petr, Ivan OHLÍDAL, Alberto MONTAIGNE RAMIL, Alberta BONNANNI and Helmut SITTER. Atomic force microscopy analysis of morphology of the upper boundaries of GaN thin films prepared by MOCVD. Vacuum. USA: ELSEVIER (PERGAMON), 2005, vol. 80, 1-3, p. 53-57. ISSN 0042-207X.
      More: https://is.muni.cz/publication/630333/en
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