Masaryk University

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    1998

    1. Statistical properties of the near-field speckle patterns of thin films with slightly rough boundaries
      FRANTA, Daniel and Ivan OHLÍDAL. Statistical properties of the near-field speckle patterns of thin films with slightly rough boundaries. Optics Communications. Amsterdam: Elsevier Science, 1998, vol. 147, No 1, p. 349-358. ISSN 0030-4018.
      More: https://is.muni.cz/publication/206015/en
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