Masaryk University

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    2004

    1. Characterization of thin oxide films on GaAs substrates by optical methods and atomic force microscopy
      FRANTA, Daniel, Ivan OHLÍDAL, Petr KLAPETEK and Miloslav OHLÍDAL. Characterization of thin oxide films on GaAs substrates by optical methods and atomic force microscopy. Surface and Interface Analysis. USA: John Wiley & Sons., 2004, vol. 36, No 8, p. 1203-1206. ISSN 0142-2421.
      More: https://is.muni.cz/publication/562878/en
    2. Optical properties of ZnTe films prepared by molecular beam epitaxy
      FRANTA, Daniel, Ivan OHLÍDAL, Petr KLAPETEK, Alberto MONTAIGNE-RAMIL, Alberta BONANNI, David STIFTER and Helmut SITTER. Optical properties of ZnTe films prepared by molecular beam epitaxy. Thin Solid Films. Oxford, UK: Elsevier, 2004, vol. 468, 1-2, p. 193-202. ISSN 0040-6090.
      More: https://is.muni.cz/publication/562879/en

    1999

    1. Optical characterization of multilayer systems with randomly rough boundaries
      OHLÍDAL, Ivan, František VIŽĎA and Miloslav OHLÍDAL. Optical characterization of multilayer systems with randomly rough boundaries. In 18th Congress of the International Commision for Optics: Optics for the Next Millennium. Billingham, Washington, USA: SPIE - The International Society for Optical Engineering, 1999, p. 150-151. SPIE Volume 3749. ISBN 0-8194-3234-2.
      More: https://is.muni.cz/publication/207732/en
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