Masaryk University

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    2002

    1. Analysis of the boundaries of ZrO2 and HfO2 thin films by atomic force microscopy and the combined optical method
      KLAPETEK, Petr, Ivan OHLÍDAL, Daniel FRANTA and Pavel POKORNÝ. Analysis of the boundaries of ZrO2 and HfO2 thin films by atomic force microscopy and the combined optical method. Surface and Interface Analysis. USA: John Wiley & Sons, 2002, vol. 34, No 1, p. 559-564. ISSN 0142-2421.
      More: https://is.muni.cz/publication/404727/en
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