Publication Records

CAMPBELLOVÁ, Anna, Petr KLAPETEK and Miroslav VALTR. Tip-sample relaxation as a source of uncertainty in nanoscale scanning probe microscopy measurements. Measurement Science and Technology. Bristol, England: IOP Publishing, 2009, vol. 20, No 084014, 6 pp. ISSN 0957-0233.

VALTR, Miroslav, Petr KLAPETEK, Vilma BURŠÍKOVÁ, Ivan OHLÍDAL and Daniel FRANTA. Surface morphology of amorphous hydrocarbon thin films deposited in pulsed radiofrequency discharge. Chem. listy. Praha: Česká společnost chemická, 2008, vol. 102, No 16, p. 1529-1532. ISSN 0009-2770.

ANDREEV, A., R. RESEL, M.D. SMILGIES, H. HOPPE, G. MATT, H. SITTER, N. S. SARICIFTCI, D. MEISSNER, H. PLANK and O. ZRZAVECKA. Oriented organic semiconductor thin films. Synthetic Metals. Elsevier, 2003, 138/2003, 1-2, p. 59-63. ISSN 0379-6779.

ZAJÍČKOVÁ, Lenka, Siegmar RUDAKOWSKI, Hans-Werner BECKER, Dirk MEYER, Miroslav VALTR and Klaus WIESEMANN. Study of Plasma Polymerization from Acetylene in Pulsed RF Discharges. Thin Solid Films. Oxford: Elsevier, 2003, vol. 2003, No 425, p. 72-84. ISSN 0040-6090.

KLAPETEK, Petr and Ivan OHLÍDAL. Theoretical analysis of the atomic force microscopy characterization of columnar thin films. Ultramicroscopy. Amsterdam: Elsevier, 2003, vol. 94, No 1, p. 19-29. ISSN 0304-3991.

KLAPETEK, Petr, Ivan OHLÍDAL and Daniel FRANTA. Applications of atomic force microscopy for thin film boundary measurements. Jemná mechanika a optika. Přerov: Physical Institute, ASCR, 2002, vol. 47, 6-7, p. 195-199. ISSN 0447-6441.

FRANTA, Daniel, Ivan OHLÍDAL and Petr KLAPETEK. Analysis of Slightly Rough Thin Films by Optical Methods and AFM. Mikrochim. Acta. Wien: Springer-Verlag, 2000, vol. 132, No 1, p. 443-447. ISSN 0026-3672.

RAITERI, Roberto, Gabrielle NELLES, Hans-Jurgen BUTT, Wolfgang KNOLL and Petr SKLÁDAL. Sensing of biological substances based on the bending of microfabricated cantilevers. Sensors and Actuators B Chemical. Amsterdam (Holandsko): Elsevier, 1999, vol. 61, No 1, p. 213-217. ISSN 0925-4005.

OHLÍDAL, Ivan, Daniel FRANTA, Jaroslav HORA, Karel NAVRÁTIL, Jan WEBER and Pavel JANDA. Analysis of thin films with slightly rough boundaries. Mikrochim. Acta. Wien: Springer-Verlag, 1998, Suppl. 15, No 1, p. 177-180. ISSN 0026-3672.