Publication Records

WANG, Chennan, Ondřej CAHA, Filip MÜNZ, Petr KOSTELNÍK, Tomáš NOVÁK and Josef HUMLÍČEK. Mid-infrared ellipsometry, Raman and X-ray diffraction studies of AlxGa1-xN/AlN/Si structures. Applied Surface Science. Amsterdam: Elsevier Science, 2017, vol. 421, November, p. 859-865. ISSN 0169-4332. Available from: https://dx.doi.org/10.1016/j.apsusc.2017.02.056.

BARTÁKOVÁ, Sonia, Patrik PRACHÁR, Stanislav HASOŇ, Raimo SILVENNOINEN, Ladislav CVRČEK, Luděk STRAŠÁK, Lukáš FOJT, Antonis AVRANAS and Vladimír VETTERL. Biofyzikální mechanismy určující biokompatibilitu dentálních implantátů a podmiňující jejich oseointegraci (Biophysical mechanisms determining dental implants biocompatibility and conditioning their osseointegration). Česká Stomatologie. Praha: ČLS JEP, 2009, vol. 109, No 3, p. 48-53. ISSN 1213-0613.

NEČAS, David, Lenka ZAJÍČKOVÁ, Daniel FRANTA, Pavel SŤAHEL, Petr MIKULÍK, Mojmír MEDUŇA and Miroslav VALTR. Optical Characterization of Ultra-Thin Iron and Iron Oxide Films. e-Journal of Surface Science and Nanotechnology. Tokyo: The Surface Science Society of Japan, 2009, vol. 7, březen, p. 486-490. ISSN 1348-0391.

OHLÍDAL, Ivan and David NEČAS. Influence of shadowing on ellipsometric quantities of randomly rough surfaces and thin films. Journal of modern optics. Londýn: Taylor & Francis Ltd., 2008, vol. 55, No 7, p. 1077-1099. ISSN 0950-0340.

MARŠÍK, Přemysl and Josef HUMLÍČEK. Multiplate misalignment artifacts in rotating-complensator ellipsometry: Analysis and data treatment. physica status solidi (c). Weinheim: WILEY-VCH Verlag GmbH, 2008, vol. 5, No 5, p. 1064-1067. ISSN 1610-1634.

MARŠÍK, Přemysl and Mikhail BAKLANOV. Optical characteristics and UV modification of low-k materials. In 9th International Conference on Solid-State and Integrated-Circuit Technology, 2008. ICSICT 2008. Beijing: IEEE, 2008, p. 765-768. ISBN 978-1-4244-2185-5.

NEČAS, David, Vratislav PEŘINA, Daniel FRANTA, Ivan OHLÍDAL and Josef ZEMEK. Optical characterization of non-stoichiometric silicon nitride films. physica status solidi (c). Weinheim: WILEY-VCH Verlag GmbH, 2008, vol. 5, No 5, p. 1320-1323. ISSN 1610-1634.

ESLAVA, Salvador, Guillaume EYMERY, Přemysl MARŠÍK, Francesca IACOPI, Christine KIRSCHHOCK, Karen MAEX, Johan MARTENS and Mikhail BAKLANOV. Optical Property Changes in Low-k Films upon Ultraviolet-Assisted Curing. Journal of the electrochemical society. New York: The Electrochemical Society, 2008, vol. 155, No 5, p. G115-G120, 6 pp. ISSN 0013-4651.

FRANTA, Daniel, Ivan OHLÍDAL and David NEČAS. Optical quantities of rough films calculated by Rayleigh-Rice theory. physica status solidi (c). Weinheim: WILEY-VCH Verlag GmbH, 2008, vol. 5, No 5, p. 1395–1398. ISSN 1610-1634.

MARŠÍK, Přemysl, Patrick VERDONCK, Dieter SCHNEIDER, David DE ROEST, Shinya KANEKO and Mikhail BAKLANOV. Spectroscopic elipsometry and ellipsometric porosimetry studies of CVD low-k dielectric films. physica status solidi (c). Weinheim: WILEY-VCH Verlag GmbH, 2008, vol. 5, No 5, p. 1253-1256. ISSN 1610-1634.

OHLÍDAL, Ivan, David NEČAS and Daniel FRANTA. Spectroscopic ellipsometry and reflectometry of statistically rough surfaces exhibiting wide intervals of spatial frequencies. physica status solidi (c). Weinheim: WILEY-VCH Verlag GmbH, 2008, vol. 5, No 5, p. 1399–1402. ISSN 1610-1634.

HUMLÍČEK, Josef, Adam DUBROKA, Přemysl MARŠÍK, Dominik MUNZAR, A.V. BORIS and Christian BERNHARD. Frequency- and temperature-dependent conductivity at the metal-insulator transition in phosphorus doped silicon studied by far-infrared ellipsometry. In CP893, Physics of Semiconductors, 28th International Conference. USA: American Institute of Physics, 2007, p. 33-34. ISBN 978-0-7354-0397-0.

OHLÍDAL, Ivan, Daniel FRANTA, Martin ŠILER, František VIŽĎA, Miloslav FRUMAR, Jaroslav JEDELSKÝ and Jaroslav OMASTA. Comparison of dispersion models in the optical characterization of As-S chalcogenide thin films. Journal of Non-Crystalline Solids. NORTH-HOLLAND, 2006, vol. 352, 52-54, p. 5633-5641, 8 pp. ISSN 0022-3093.

FRANTA, Daniel, Ivan OHLÍDAL, Petr KLAPETEK, Růžena NEPUSTILOVÁ and Svatopluk BAJER. Characterization of polymer thin films deposited on aluminum films by the combined optical method and atomic force microscopy. Surface and Interface Analysis. USA: John Wiley & Sons, 2006, vol. 38, No 4, p. 842-846. ISSN 0142-2421.

FRANTA, Daniel and Ivan OHLÍDAL. Influence of lateral dimensions of the irregularities on the optical quantities of rough surfaces. Journal of Optics A: Pure and Applied Optics. Bristol, GB: IOP Publishing Ltd, 2006, vol. 8, No 9, p. 763-774. ISSN 1464-4258.

VALTR, Miroslav, Ivan OHLÍDAL and Daniel FRANTA. Optical characterization of carbon films prepared by PECVD using ellipsometry and reflectometry. Czech. J. Phys. Praha: Institute of Physics Academy of Sciences, 2006, 56/2006, Suppl. B, p. 1103 - 1109. ISSN 0011-4626.

OHLÍDAL, Ivan, Daniel FRANTA and Petr KLAPETEK. Combination of optical methods and atomic force microscopy at characterization of thin film systems. Acta physica slovaca. Bratislava: Institute of Physics, SAS, 2005, vol. 55, No 3, p. 271-294. ISSN 0323-0465.

FRANTA, Daniel and Ivan OHLÍDAL. Comparison of effective medium approximation and Rayleigh-Rice theory concerning ellipsometric characterization of rough surfaces. Optics Communications. Amsterdam: Elsevier Science, 2005, vol. 248, No 1, p. 459-467. ISSN 0030-4018.

OHLÍDAL, Ivan, Daniel FRANTA and Petr KLAPETEK. Ellipsometry in characterization of thin films. In Proceedings of the SREN 2005. Bratislava, Slovakia: Comenius University, 2005, p. 81-111. ISBN 80-223-2099-4.

JAN, Mistrík, Ivan OHLÍDAL, Roman ANTOŠ, Mitsuru AOYAMA and Tomuo YAMAGUCHI. Evidence of refractive index change in glass substrates induced by high-density reactive ion plating deposition of SiO2 films. Applied Surface Science. USA: ELSEVIER (NORTH-HOLLAND), 2005, vol. 244, 1-4, p. 51-54. ISSN 0169-4332.

FRANTA, Daniel and Ivan OHLÍDAL. Characterization of optical thin films exhibiting defects. In Advances in Optical Thin Films II. Bellingham, Washington, USA: SPIE - The International Society for Optical Engineering, 2005, p. 59632H-1-59632H-12, 12 pp. ISBN 0-8194-5981-X.

PŘIKRYL, Radek, Ladislav ČECH, Lenka ZAJÍČKOVÁ, Jan VANĚK, S. BEHZADI and F.R. JONES. Mechanical and optical properties of plasma-polymerized vinyltriethoxysilane. Surface & coatings technology. Elsevier Science, 2005, vol. 200, 1-4, p. 468-471. ISSN 0257-8972.

ŠILER, Martin, Ivan OHLÍDAL, Daniel FRANTA, Alberto MONTAIGNE-RAMIL, Alberta BONANNI, David STIFTER and Helmut SITTER. Optical characterization of double layers containing epitaxial ZnSe and ZnTe films. Journal of Modern Optics. London, UK: Taylor and Francis, LtD, 2005, vol. 52, No 4, p. 583-602. ISSN 0950-0340.

FRANTA, Daniel, Ivan OHLÍDAL, Jan MISTÍK, Tomuo YAMAGUCHI, Gu Jin HU and Ning DAI. Optical characterization of sol-gel deposited PZT thin films by spectroscopic ellipsometry and reflectometry in near-UV and visible regions. Applied Surface Science. USA: ELSEVIER (NORTH-HOLLAND), 2005, vol. 244, 1-4, p. 338-342. ISSN 0169-4332.

FRANTA, Daniel, Ivan OHLÍDAL and David PETRÝDES. Optical Characterization of TiO2 Thin Films by the Combined Method of Spectroscopic Ellipsometry and Spectroscopic Photometry. Vacuum. USA: ELSEVIER (PERGAMON), 2005, vol. 80, 1-3, p. 159-162. ISSN 0042-207X.

FRANTA, Daniel, Beatrice NEGULESCU, Luc THOMAS, Pierre Richard DAHOO, Marcel GUYOT, Ivan OHLÍDAL, Jan MISTRÍK and Tomuo YAMAGUCHI. Optical properties of NiO thin films prepared by pulsed laser deposition technique. Applied Surface Science. USA: ELSEVIER (NORTH-HOLLAND), 2005, vol. 244, 1-4, p. 426-430. ISSN 0169-4332.

MISTRÍK, Jan, Tomuo YAMAGUCHI, Daniel FRANTA, Ivan OHLÍDAL, Gu Jin HU and Ning DAI. Optical properties of slightly rough LaNiO3 thin films studied by spectroscopic ellipsometry and reflectometry. Applied Surface Science. USA: ELSEVIER (NORTH-HOLLAND), 2005, vol. 244, 1-4, p. 431-434. ISSN 0169-4332.

HUMLÍČEK, Josef. Polarized light and ellipsometry. In Handbook of Ellipsometry. New York: William Andrew Publishing, 2005, p. 3-91. Handbook of Ellipsometry. ISBN 0-8155-1499-9.

ANTOŠ, Roman, Jaromír PIŠTORA, Ivan OHLÍDAL, Kamil POSTAVA, Jan MISTRÍK, Tomuo YAMAGUCHI and Štefan VIŠŇOVSKÝ. Specular spectroscopic ellipsometry for the critical dimension monitoring of gratings fabricated on a thick transparent plate. Journal of Applied Physics. USA: American Institute of Physics, 2005, vol. 97, No 5, p. 053107-1-053107-7, 7 pp. ISSN 0021-8979.

BERNHARD, Christian, Todd HOLDEN, Alexandr BORIS, Natalia KOVALEVA, Alexei PIMENOV and Josef HUMLÍČEK. Anomalous oxygen-isotope effect on the in-plane far-infrared conductivity of detwinned (YBa2Cu3O6.9)-O-16,18. Physical Review B. USA: The American Physical Society, 2004, vol. 69, No 5, p. 2502-4, 4 pp. ISSN 0163-1829.

FRANTA, Daniel, Ivan OHLÍDAL, Petr KLAPETEK and Pere ROCA I CABARROCAS. Complete Characterization of Rough Polymorphous Silicon Films by Atomic Force Microscopy and the Combined Method of Spectroscopic Ellipsometry and Spectroscopic Reflectometry. Thin Solid Films. Oxford, UK: Elsevier science, 2004, 455-456, No 1, p. 399-403. ISSN 0040-6090.

OHLÍDAL, Ivan, Daniel FRANTA, Miroslav FRUMAR, Jaroslav JEDELSKÝ and Jaroslav OMASTA. Influence of Composition, Exposure and Thermal Annealing on Optical Properties of As-S Chalcogenide Thin Films. Journal of Optoelectronics and Advanced Materials. Bucharest: INOE & INFM, 2004, vol. 6, No 1, p. 139-148. ISSN 1454-4164.

FRANTA, Daniel, Ivan OHLÍDAL, Vilma BURŠÍKOVÁ and Lenka ZAJÍČKOVÁ. Optical Properties of Diamond-Like Carbon Films Containing SiOx Studied by the Combined Method of Spectroscopic Ellipsometry and Spectroscopic Reflectometry. Thin Solid Films. Oxford, UK: Elsevier science, 2004, 455-456, No 1, p. 393-398. ISSN 0040-6090.

FRANTA, Daniel, Lenka ZAJÍČKOVÁ, Vilma BURŠÍKOVÁ and Ivan OHLÍDAL. New Dispersion Model of the Optical Constants of the DLC Films. Acta Physica Slovaca. Bratislava: Institute of Physics, SAS, 2003, vol. 53, No 5, p. 373-384. ISSN 0323-0465.

FRANTA, Daniel, Ivan OHLÍDAL, Petr KLAPETEK, Alberto MONTAIGNE-RAMIL, Alberta BONANNI, David STIFTER and Helmut SITTER. Optical characterization of ZnSe thin films. In 19th Congress of the International Commission for Optics: Optics for the Quality of Life. Bellingham, Washington, USA: SPIE - The International Society for Optical Engineering, 2003, p. 831-832. ISBN 0-8194-4596-7.

FRANTA, Daniel, Ivan OHLÍDAL, Vilma BURŠÍKOVÁ and Lenka ZAJÍČKOVÁ. Optical properties of diamond-like carbon films containing SiOx. Diamond and Related Materials. Amsterdam: Elsevier, 2003, vol. 12, No 9, p. 1532-1538. ISSN 0925-9635.

FRANTA, Daniel, Lenka ZAJÍČKOVÁ, Ivan OHLÍDAL, Jan JANČA and Kateřina VELTRUSKÁ. Optical characterization of diamond like carbon films using multi-sample modification of variable angle spectroscopic ellipsometry. Diamond and Related Materials. Amsterdam: Elsevier, 2002, vol. 11, No 1, p. 105-117. ISSN 0925-9635.

FRANTA, Daniel, Lenka ZAJÍČKOVÁ, Ivan OHLÍDAL and Jan JANČA. Optical Characterization of Diamond-like Carbon Films. Vacuum. USA: ELSEVIER (PERGAMON), 2001, vol. 61, 2-4, p. 279-283. ISSN 0042-207X.

FRANTA, Daniel, Ivan OHLÍDAL, Miloslav FRUMAR and Jaroslav JEDELSKÝ. Optical Characterization of Chalcogenide Thin Films. Applied Surface Science. USA: ELSEVIER (NORTH-HOLLAND), 2001, 175-176, No 1, p. 555-561. ISSN 0169-4332.

BRZOBOHATÝ, Oto, Lenka ZAJÍČKOVÁ and Vilma BURŠÍKOVÁ. Optical Properties of Si Incorporated Diamond-like Carbon Films Deposited by RF PECVD. In JUNIORMAT 01. 1st ed. Brno: ÚMI VUT FSI v Brně ve spolupráci s Českou společností pro nové materiály a technologie, 2001, p. 144-145. ISBN 80-214-1885-0.

ZAJÍČKOVÁ, Lenka, Kateřina VELTRUSKÁ, Nataliya TSUD and Daniel FRANTA. XPS and Ellipsometric Study of DLC/Silicon Interface. Vacuum. USA: ELSEVIER (PERGAMON), 2001, vol. 61, 2-4, p. 269-273. ISSN 0042-207X.

ELIÁŠ, Marek, Lenka ZAJÍČKOVÁ, Vilma BURŠÍKOVÁ, Jan JANČA and Michal LORENC. Deposition of nanocomposite CNx/SiO films in inductively coupled r.f. discharge. Diamond and Related Materials. New York: Elsevier Science S.A., 2000, vol. 9, No 7, p. 552-555. ISSN 0925-9635.

PAVELKA, Radek, Ivan OHLÍDAL, Jan HLÁVKA, Daniel FRANTA and Helmut SITTER. Optical characterization of thin films with randomly rough boundaries using the photovoltage method. Thin Solid Films. UK Oxford: Elsevier science, 2000, vol. 366, No 1, p. 43-50. ISSN 0040-6090.

LORENC, Michal, Jan ŠIK, Alois NEBOJSA, Karel NAVRÁTIL, Josef HUMLÍČEK, V. VORLIČEK and E. HULICIUS. Optical characterisation of a thick MOVPE InSb film on GaAs. In Workshop proceedings EW MOVPE VIII. Prague: Institute of Physics ASCR, CR, 1999, p. 369-372. ISBN 80-238-3551-3.

HUMLÍČEK, Josef. Ellipsometric study of fano resonance in heavily doped p-type Si and SiGe alloys. Thin Solid Films. UK Oxford: Elsevier science, 1998, vol. 1998, 313-314, p. 656-660. ISSN 0040-6090.

HUMLÍČEK, Josef, Alois NEBOJSA, J. HORA, M. STRÁSKÝ, J. SPOUSTA and T. ŠIKOLA. Ellipsometry and transport studies of thin-film metal nitrides. Thin Solid Films. UK Oxford: Elsevier science, 1998, vol. 1998, No 332, p. 25-29. ISSN 0040-6090.

HUMLÍČEK, Josef. Infrared ellipsometry of LiF. Thin Solid Films. UK Oxford: Elsevier science, 1998, vol. 1998, 313-314, p. 687-691. ISSN 0040-6090.

HAMMA, S., Pavel SŤAHEL and C.P. ROCCA. Optimum crystalline fraction in p-(ľcSi:H) layers for pin solar cells: in-situ study by ellipsometry and Kelvin probe. In 2nd WCEPSE. 1st ed. Wien: University of Wien, 1998, p. 10-13.

BORTCHAGOVSKY, E., I. YURCHENKO, Z. KAZANTSEVA, Josef HUMLÍČEK and J. HORA. Spectroscopic ellipsometry of fullerene embedded langmuir-blodgett films with surface plasmon excitation. Thin Solid Films. UK Oxford: Elsevier science, 1998, vol. 1998, 313-314, p. 795-798. ISSN 0040-6090.

ROCCA, C.P., Pavel SŤAHEL and S. HAMMA. Stable single junction P-I-N solar cells with efficiencies approaching 10%. In 2nd WCEPSE. 1st ed. Wien: University of Wien, 1998, p. 32-35.