Publication Records

FARAGÓ, Tomáš, Petr MIKULÍK, A. ERSHOV, M. VOGELGESANG, D. HANSCHKE and T. BAUMBACH. syris: a flexible and efficient framework for X-ray imaging experiments simulation. Journal of Synchrotron Radiation. CHESTER: INT UNION CRYSTALLOGRAPHY, 2017, vol. 24, November, p. 1283-1295. ISSN 1600-5775. Available from: https://dx.doi.org/10.1107/S1600577517012255.

BOMMEL, S., N. KLEPPMANN, C. WEBER, H. SPRANGER, P. SCHAFER, Jiří NOVÁK, S. ROTH, F. SCHREIBER, S.H.L. KLAPP and S. KOWARIK. Unravelling the multilayer growth of the fullerene C-60 in real time. NATURE COMMUNICATIONS. LONDON: NATURE PUBLISHING GROUP, 2014, vol. 5, 5. 11. 2014, p. 1-8. ISSN 2041-1723. Available from: https://dx.doi.org/10.1038/ncomms6388.

MIKULÍK, Petr. X-ray reflectometry and diffuse scattering. 2007th ed. Smolenice (Slovensko): 7th Autumn School on X-ray scattering from surfaces and thin layers, 2007. international workshop.

CAHA, Ondřej, Vlastimil KŘÁPEK, Václav HOLÝ, S. MOSS, J. LI, A. NORMAN, A. MASCARENHAS, J. RENO, J. STANGL and Mojmír MEDUŇA. X-ray diffraction on laterally modulated (InAs)n/(AlAs)m short-period superlattices. Journal of Applied Physics. USA: American Institute of Physics, 2004, vol. 96, No 9, p. 4833-4838. ISSN 0021-8979.

SOBOTA, J., Zdeněk BOCHNÍČEK and Václav HOLÝ. Friction and wear properties of C-N/MeNx nanolayer composites. Thin Solid Films. Oxford, UK: Elsevier science, 2003, vol. 94, No 12, p. 155-159. ISSN 0040-6090.

MIKULÍK, Petr, T. BAUMBACH, D. KORYTÁR, P. PERNOT, D. LÜBBERT, L. HELFEN and Ch. LANDESBERGER. Advanced X-ray diffraction imaging techniques for semiconductor wafer characterisation. Materials Structure. Praha: The Czech and Slovak Cryst. Assoc., 2002, vol. 9, No 2, p. 87-88. ISSN 1211-5894.

SPRINGHOLZ, Gunther and Václav HOLÝ. Self-organized ordering in self-assembled quantum dot superlattices. Material Sci. and Engn. 2002, B88, No 10, p. 143-157. ISSN 0255-5476.

SOBOTA, Jaroslav, Zdeněk BOCHNÍČEK, Václav HOLÝ, G. SORENSEN and H. JENSEN. C-N/MeN nanocomposite coatings, deposition and testing of performance. Surface and coating technology. New York: ELSEVIER, 2001, vol. 142, No 142, p. 590-595. ISSN 0257-8972.

MEDUŇA, Mojmír, Václav HOLÝ, Josef KUBĚNA, Julian STANGL, Gunter BAUER, Jian-hong ZHU and Karl BRUNNER. RTG reflexe laterálních struktur SiGe (X-ray reflection on lateral structures SiGe). In 13. konference slovenských a českých fyzikov. Zvolen: Slovenská fyzikálna spoločnosť, 2000, p. 237-239. ISBN 80-228-0876-8.

MIKULÍK, Petr. Scattering on aperiodic superlattices. In Beyond Quasicrystals. Les Ulis: Les Editions de Physique, 1995, p. 229-247. ISBN 3540592512.