Výpis publikací

2005

1. Optical characterization of double layers containing epitaxial ZnSe and ZnTe films

   ŠILER, Martin, Ivan OHLÍDAL, Daniel FRANTA, Alberto MONTAIGNE-RAMIL, Alberta BONANNI, David STIFTER a Helmut SITTER. Optical characterization of double layers containing epitaxial ZnSe and ZnTe films. Journal of Modern Optics. London, UK: Taylor and Francis, LtD, 2005, roč. 52, č. 4, s. 583-602. ISSN 0950-0340.

   Podrobněji: https://is.muni.cz/publication/605344/cs