Výpis publikací

2005

1. Optical properties of slightly rough LaNiO3 thin films studied by spectroscopic ellipsometry and reflectometry

   MISTRÍK, Jan, Tomuo YAMAGUCHI, Daniel FRANTA, Ivan OHLÍDAL, Gu Jin HU a Ning DAI. Optical properties of slightly rough LaNiO3 thin films studied by spectroscopic ellipsometry and reflectometry. Applied Surface Science. USA: ELSEVIER (NORTH-HOLLAND), 2005, roč. 244, 1-4, s. 431-434. ISSN 0169-4332.

   Podrobněji: https://is.muni.cz/publication/621519/cs