Masaryk University

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    2004

    1. Atomic Force Microscopy Analysis of Statistical Roughness of GaAs Surfaces Originated by Thermal Oxidation
      KLAPETEK, Petr, Ivan OHLÍDAL and Karel NAVRÁTIL. Atomic Force Microscopy Analysis of Statistical Roughness of GaAs Surfaces Originated by Thermal Oxidation. Microchimica Acta. Wien: Springer-Verlag, 2004, vol. 147, No 3, p. 175-180. ISSN 0026-3672.
      More: https://is.muni.cz/publication/562896/en
    2. Characterization of thin oxide films on GaAs substrates by optical methods and atomic force microscopy
      FRANTA, Daniel, Ivan OHLÍDAL, Petr KLAPETEK and Miloslav OHLÍDAL. Characterization of thin oxide films on GaAs substrates by optical methods and atomic force microscopy. Surface and Interface Analysis. USA: John Wiley & Sons., 2004, vol. 36, No 8, p. 1203-1206. ISSN 0142-2421.
      More: https://is.muni.cz/publication/562878/en

    2001

    1. X-ray diffraction from CuPt-ordered III-V ternary semiconductor alloy films
      LI, J. H., J. KULIK and V. HOLY. X-ray diffraction from CuPt-ordered III-V ternary semiconductor alloy films. Phys. Rev. B. USA: The American Phys. Society, 2001, vol. 63, No 15, p. 5310-5316. ISSN 0163-1829.
      More: https://is.muni.cz/publication/385314/en

    2000

    1. Some Problems Concerning the Thematic and the Rhematic Layers in the Text
      ADAM, Martin. Some Problems Concerning the Thematic and the Rhematic Layers in the Text. 2000th ed. Brno: Faculty of Arts, Masaryk University, 2000, 65 pp. An unpublished M.A. dissertation.
      More: https://is.muni.cz/publication/487767/en
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