Masaryk University

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    2004

    1. Atomic Force Microscopy Analysis of Statistical Roughness of GaAs Surfaces Originated by Thermal Oxidation
      KLAPETEK, Petr, Ivan OHLÍDAL and Karel NAVRÁTIL. Atomic Force Microscopy Analysis of Statistical Roughness of GaAs Surfaces Originated by Thermal Oxidation. Microchimica Acta. Wien: Springer-Verlag, 2004, vol. 147, No 3, p. 175-180. ISSN 0026-3672.
      More: https://is.muni.cz/publication/562896/en
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