Publication Records

JANČÁŘ, Luděk and Lucie SICHOVÁ. E-learning - optické analytické metody (E-learning - optical analytical methods). In Acta Fac. Paed. Univ. Tyrnaviensis, Ser. D., Supplementum 2, No. 12. Trnava, 2008, p. 267-270. ISBN 978-80-8082-182-1.

KLAPETEK, Petr, Ivan OHLÍDAL, Daniel FRANTA, Alberto MONTAIGNE-RAMIL, Alberta BONANNI, David STIFTER and Helmut SITTER. Atomic force microscopy characterization of ZnTe epitaxial films. Acta Physica Slovaca. Bratislava: Institute of Physics, SAS, 2003, vol. 53, No 3, p. 223-230. ISSN 0323-0465.

KLAPETEK, Petr, Ivan OHLÍDAL, Daniel FRANTA and Pavel POKORNÝ. Analysis of the boundaries of ZrO2 and HfO2 thin films by atomic force microscopy and the combined optical method. Surface and Interface Analysis. USA: John Wiley & Sons, 2002, vol. 34, No 1, p. 559-564. ISSN 0142-2421.

OHLÍDAL, Ivan. Optical methods for surface characterization. In 11th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics. Bellingham, Washington, USA: SPIE - The International Society for Optical Engineering, 1999, p. 429-440. SPIE Proceeding Series, Volume 3820. ISBN 0-8194-3306-3.