Masaryk University

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    2002

    1. Optical characterization of thin films non-uniform in thickness by a multiple-wavelength reflectance method
      OHLÍDAL, Miloslav, Ivan OHLÍDAL, Daniel FRANTA, Tomáš KRÁLÍK, Miloš JÁKL and Marek ELIÁŠ. Optical characterization of thin films non-uniform in thickness by a multiple-wavelength reflectance method. Surface and Interface Analysis. USA: John Wiley & Sons, 2002, vol. 34, No 1, p. 660-663. ISSN 0142-2421.
      More: https://is.muni.cz/publication/407704/en
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