Publication Records

FRANTA, Daniel, Ivan OHLÍDAL and David NEČAS. Influence of cross-correlation effects on the optical quantities of rough films. Optics Express. elektronicky: Optical Society of America, 2008, vol. 16, No 11, p. 7789–7803. ISSN 1094-4087.

FRANTA, Daniel and Ivan OHLÍDAL. Influence of lateral dimensions of the irregularities on the optical quantities of rough surfaces. Journal of Optics A: Pure and Applied Optics. Bristol, GB: IOP Publishing Ltd, 2006, vol. 8, No 9, p. 763-774. ISSN 1464-4258.

KLAPETEK, Petr, Ivan OHLÍDAL, Alberto MONTAIGNE RAMIL, Alberta BONNANNI and Helmut SITTER. Atomic force microscopy analysis of morphology of the upper boundaries of GaN thin films prepared by MOCVD. Vacuum. USA: ELSEVIER (PERGAMON), 2005, vol. 80, 1-3, p. 53-57. ISSN 0042-207X.

OHLÍDAL, Ivan, Daniel FRANTA and Petr KLAPETEK. Combination of optical methods and atomic force microscopy at characterization of thin film systems. Acta physica slovaca. Bratislava: Institute of Physics, SAS, 2005, vol. 55, No 3, p. 271-294. ISSN 0323-0465.

FRANTA, Daniel and Ivan OHLÍDAL. Comparison of effective medium approximation and Rayleigh-Rice theory concerning ellipsometric characterization of rough surfaces. Optics Communications. Amsterdam: Elsevier Science, 2005, vol. 248, No 1, p. 459-467. ISSN 0030-4018.

FRANTA, Daniel and Ivan OHLÍDAL. Characterization of optical thin films exhibiting defects. In Advances in Optical Thin Films II. Bellingham, Washington, USA: SPIE - The International Society for Optical Engineering, 2005, p. 59632H-1-59632H-12, 12 pp. ISBN 0-8194-5981-X.

HASOŇ, Stanislav and Vladimír VETTERL. Application of thin film mercury electrodes and solid amalgam electrodes in electrochemical analysis of the nucleic acids components: detection of the two-dimensional phase transients of adenosine. Bioelectrochemistry. Elsevier, 2004, vol. 2004, No 63, p. 37-41. ISSN 1567-5394.

KLAPETEK, Petr, Ivan OHLÍDAL and Jindřich BÍLEK. Influence of the atomic force microscope tip on the multifractal analysis of rough surfaces. Ultramicroscopy. Amsterdam: Elsevier, 2004, vol. 102, No 1, p. 51-59. ISSN 0304-3991.

KLAPETEK, Petr, Ivan OHLÍDAL and Daniel FRANTA. Applications of atomic force microscopy for thin film boundary measurements. Jemná mechanika a optika. Přerov: Physical Institute, ASCR, 2002, vol. 47, 6-7, p. 195-199. ISSN 0447-6441.

FRANTA, Daniel, Ivan OHLÍDAL, Dominik MUNZAR, Jaroslav HORA, Karel NAVRÁTIL, Claudio MANFREDOTTI, Franco FIZZOTTI and Ettore VITTONE. Complete optical characterization of imperfect hydrogenated amorphous silicon layers by spectroscopic ellipsometry and spectroscopic reflectometry. Thin Solid Films. Oxford, UK: Elsevier science, 1999, 343-344, No 1, p. 295-298. ISSN 0040-6090.