Masaryk University

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    2008

    1. Composition and functional properties of organosilicon plasma polymers from hexamethyldisiloxane and octamethylcyclotetrasiloxane
      ZAJÍČKOVÁ, Lenka, Zuzana KUČEROVÁ, Vilma BURŠÍKOVÁ, Daniel FRANTA, Vratislav PEŘINA and Anna MACKOVÁ. Composition and functional properties of organosilicon plasma polymers from hexamethyldisiloxane and octamethylcyclotetrasiloxane. In ORGANIC/INORGANIC HYBRID MATERIALS - 2007. WARRENDALE: MATERIALS RESEARCH SOCIETY, 2008, p. 159-164. ISBN 978-1-55899-967-1.
      More: https://is.muni.cz/publication/839392/en
    2. Optical characterization of phase changing Ge2Sb2Te5 chalcogenide films
      FRANTA, Daniel, Martin HRDLIČKA, David NEČAS, Miloslav FRUMAR, Ivan OHLÍDAL and Martin PAVLIŠTA. Optical characterization of phase changing Ge2Sb2Te5 chalcogenide films. physica status solidi (c). Weinheim: WILEY-VCH Verlag GmbH, 2008, vol. 5, No 5, p. 1324-1327. ISSN 1610-1634.
      More: https://is.muni.cz/publication/798278/en
    3. Optical quantities of rough films calculated by Rayleigh-Rice theory
      FRANTA, Daniel, Ivan OHLÍDAL and David NEČAS. Optical quantities of rough films calculated by Rayleigh-Rice theory. physica status solidi (c). Weinheim: WILEY-VCH Verlag GmbH, 2008, vol. 5, No 5, p. 1395–1398. ISSN 1610-1634.
      More: https://is.muni.cz/publication/798388/en

    2004

    1. Atomic Force Microscopy Analysis of Statistical Roughness of GaAs Surfaces Originated by Thermal Oxidation
      KLAPETEK, Petr, Ivan OHLÍDAL and Karel NAVRÁTIL. Atomic Force Microscopy Analysis of Statistical Roughness of GaAs Surfaces Originated by Thermal Oxidation. Microchimica Acta. Wien: Springer-Verlag, 2004, vol. 147, No 3, p. 175-180. ISSN 0026-3672.
      More: https://is.muni.cz/publication/562896/en
    2. Optical properties of ZnTe films prepared by molecular beam epitaxy
      FRANTA, Daniel, Ivan OHLÍDAL, Petr KLAPETEK, Alberto MONTAIGNE-RAMIL, Alberta BONANNI, David STIFTER and Helmut SITTER. Optical properties of ZnTe films prepared by molecular beam epitaxy. Thin Solid Films. Oxford, UK: Elsevier, 2004, vol. 468, 1-2, p. 193-202. ISSN 0040-6090.
      More: https://is.muni.cz/publication/562879/en

    2003

    1. Atomic force microscopy characterization of ZnTe epitaxial films
      KLAPETEK, Petr, Ivan OHLÍDAL, Daniel FRANTA, Alberto MONTAIGNE-RAMIL, Alberta BONANNI, David STIFTER and Helmut SITTER. Atomic force microscopy characterization of ZnTe epitaxial films. Acta Physica Slovaca. Bratislava: Institute of Physics, SAS, 2003, vol. 53, No 3, p. 223-230. ISSN 0323-0465.
      More: https://is.muni.cz/publication/489711/en

    1995

    1. MECHANISTIC ROLE OF H2O AND THE LIGAND IN THE CHEMICAL-VAPOR-DEPOSITION OF CU,CU2O, CUO, AND CU3N FROM BIS(1,1,1,5,5,5-HEXAFLUOROPENTANE-2,4-DIONATO)COPPER(II)
      PINKAS, Jiří, J. C. HUFFMAN, D. V. BAXTER, M. H. CHISHOLM and K. G. CAULTON. MECHANISTIC ROLE OF H2O AND THE LIGAND IN THE CHEMICAL-VAPOR-DEPOSITION OF CU,CU2O, CUO, AND CU3N FROM BIS(1,1,1,5,5,5-HEXAFLUOROPENTANE-2,4-DIONATO)COPPER(II). Chem. Mater. Washington DC: American Chemical Society, 1995, vol. 7, No 8, p. 1598-1605. ISSN 0897-4756.
      More: https://is.muni.cz/publication/366818/en
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