Publication Records

NÁDAŽDY, Peter, Jakub HAGARA, Matej JERGEL, Eva MAJKOVÁ, Petr MIKULÍK, Zdenko ZÁPRAŽNÝ, Dusan KORYTÁR and Peter ŠIFFALOVIČ. Exploiting the potential of beam-compressing channel-cut monochromators for laboratory high-resolution small-angle X-ray scattering experiments. Journal of Applied Crystallography. Chester: INT UNION CRYSTALLOGRAPHY, 2019, vol. 52, JUN 2019, p. 498-506. ISSN 0021-8898. Available from: https://dx.doi.org/10.1107/S1600576719003674.

BANERJEE, Rupak, Jiří NOVÁK, Christian FRANK, Maria GIRLEANU, Olivier ERSEN, Martin BRINKMANN, Falk ANGER, Christian LORCH, Johannes DIETERLE, Alexander GERLACH, Jakub DRNEC, Sun YU and Frank SCHREIBER. Structure and Morphology of Organic Semiconductor-Nanoparticle Hybrids Prepared by Soft Deposition. JOURNAL OF PHYSICAL CHEMISTRY C. Washington D.C.: American Chemical Society, 2015, vol. 119, No 9, p. 5225-5237. ISSN 1932-7447. Available from: https://dx.doi.org/10.1021/acs.jpcc.5b00480.

FRANK, C., R. BANERJEE, M. OETTEL, A. GERLACH, Jiří NOVÁK, G. SANTORO and F. SCHREIBER. Analysis of island shape evolution from diffuse x-ray scattering of organic thin films and implications for growth. Physical Review B. College (USA): American Institute of Physics, 2014, vol. 90, No 20, p. "205401", 10 pp. ISSN 1098-0121. Available from: https://dx.doi.org/10.1103/PhysRevB.90.205401.

FRANK, Christian, Jiří NOVÁK, Rupak BANERJEE, Alexander GERLACH, Frank SCHREIBER, Alexei VOROBIEV and Stefan KOWARIK. Island size evolution and molecular diffusion during growth of organic thin films followed by time-resolved specular and off-specular scattering. Physical Review B. Maryland (USA): The American Physical Society, 2014, vol. 90, No 4, p. "045410-1"-"045410-6", 6 pp. ISSN 1098-0121. Available from: https://dx.doi.org/10.1103/PhysRevB.90.045410.

STANGL, J., Václav HOLÝ, Petr MIKULÍK, G. BAUER, I. KEGEL, T.H. METZGER, O.G. SCHMIDT, C. LANGE and K. EBERL. Self-assembled carbon-induced germanium quantum dots studied by grazing-incidence small-angle x-ray scattering. Applied Physics Letters. USA: American Institute of Physics, 1999, vol. 74, -, p. 3785-3787. ISSN 0003-6951.