Masaryk University

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    2002

    1. Characterization of the boundaries of thin films of TiO2 by atomic force microscopy and optical methods
      FRANTA, Daniel, Ivan OHLÍDAL, Petr KLAPETEK and Pavel POKORNÝ. Characterization of the boundaries of thin films of TiO2 by atomic force microscopy and optical methods. Surface and Interface Analysis. USA: John Wiley & Sons, 2002, vol. 34, No 1, p. 759-762. ISSN 0142-2421.
      More: https://is.muni.cz/publication/407667/en
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