ZÁPRAŽNÝ, Z., D. KORYTÁR, M. JERGEL, P. ŠIFFALOVIČ, E. DOBROČKA, P. VAGOVIČ, C. FERRARI,
Petr MIKULÍK, M. DEMYDENKO and M. MIKLOŠKA. Calculations and surface quality measurements of high-asymmetry angle x-ray crystal monochromators for advanced x-ray imaging and metrological applications.
Optical Engineering. 2015, vol. 54, No 3, p. "035101-1"-"035101-12", 12 pp. ISSN 0091-3286. Available from: https://dx.doi.org/10.1117/1.OE.54.3.035101.