FRANTA, Daniel,
Ivan OHLÍDAL, Petr KLAPETEK and Pere ROCA I CABARROCAS. Complete Characterization of Rough Polymorphous Silicon Films by Atomic Force Microscopy and the Combined Method of Spectroscopic Ellipsometry and Spectroscopic Reflectometry.
Thin Solid Films. Oxford, UK: Elsevier science, 2004, 455-456, No 1, p. 399-403. ISSN 0040-6090.