Publication Records

WANG, Chennan, Ondřej CAHA, Filip MÜNZ, Petr KOSTELNÍK, Tomáš NOVÁK and Josef HUMLÍČEK. Mid-infrared ellipsometry, Raman and X-ray diffraction studies of AlxGa1-xN/AlN/Si structures. Applied Surface Science. Amsterdam: Elsevier Science, 2017, vol. 421, November, p. 859-865. ISSN 0169-4332. Available from: https://dx.doi.org/10.1016/j.apsusc.2017.02.056.

LORENC, Michal, Jan ŠIK, Alois NEBOJSA, Karel NAVRÁTIL, Josef HUMLÍČEK, V. VORLIČEK and E. HULICIUS. Optical characterisation of a thick MOVPE InSb film on GaAs. In Workshop proceedings EW MOVPE VIII. Prague: Institute of Physics ASCR, CR, 1999, p. 369-372. ISBN 80-238-3551-3.