Výpis publikací

2001

1. Grazing incidence small-angle x-ray scattering study of self-organized SiGe wires

   HOLY, V., T. ROCH, J. STANGL a G. BAUER. Grazing incidence small-angle x-ray scattering study of self-organized SiGe wires. Phys. Rev. B. USA: The American Phys. Society, 2001, roč. 63, č. 20, s. 5318-5327. ISSN 0163-1829.

   Podrobněji: https://is.muni.cz/publication/385311/cs
2. X-ray reflectivity of self-assembled structures in SiGe multilayers and comparison with atomic force microscopy

   MEDUŇA, Mojmír, Václav HOLÝ a T. ROCH. X-ray reflectivity of self-assembled structures in SiGe multilayers and comparison with atomic force microscopy. Journal of Applied Physics. USA: American institute of physics, 2001, roč. 89, č. 9, s. 4836-4842. ISSN 0021-8979.

   Podrobněji: https://is.muni.cz/publication/385315/cs